Santa Clara Product Safety Technical Committee (PSTC), November 26 and December 10, 1996 Meeting Notices
Please mark you calendar and join us for the following meetings: List-Post: [email protected] Date: November 26, 1996 Time: 7:00 pm Topic: Laser Safety Seminar Speaker: Mr. Bob Weiner, Weiner Associates Location: Hewlett Packard, 19447 Prunridge Ave. Cupertino CA, Bldg. 48, Oakroom Mr. Bob Weiner of Weiner Associates, a consulting firm that specializes in Laser Safety regulations, will be presenting a laser safety seminar. In this seminar, Mr. Weiner will review both U.S. and International requirements. Some of the topics of this seminar include CDRH product Classification, performance features, CDRH product labels, manuals and reports, International Standards, EN 60825 & EN 60825-1 Laser Safety Requirements and other CEN and CENELEC Laser Standards and Directives. Over the past 20 years, Mr. Weiner has assisted more than 500 companies with domestic and international laser requirements. He serves on number of different Laser Safety committees. He has presented papers at both International Safety Conferences . Dinner for November 26, 1996: If you are interested in joining the speaker for dinner at El Torito's (by Vallco Fashion Park at Wolfe and Hwy 280), it will be at 5:30 pm. RSVP to Kamran Mohajer. List-Post: [email protected] Date: Tuesday, December 10, 1996, Joint Meeting with the Santa Clara Valley Electromagnetic Compatibility Society Time and Location: Cocktails (5:00 pm) and dinner (5:30 pm) at Chilis, 20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino. Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm. Topic/Speaker: "Physics and Testing of ESD" by David Pommerenke, HP. On December 10 the Santa Clara Valley Electromagnetic Compatibility Society will hear a presentation by David Pommerenke, HP, on the topic "Physics and Testing of ESD". David Pommerenke will discuss two important aspects of ESD testing. The first addresses the issue of why air discharge seem to be so unrepeatable, and will cover the dominant variables that contribute to this aspect of ESD including charge and voltage, arc initiation, arc resistance, object impedance, currents, transient fields, and lower rise time limit. Knowing the physical parameters which determine the severeness of ESD the second part of the talk will compare ESD testing with real ESD guided by the following key questions: Is the standard rise time realistic ? What are unintended radiations? How similar are different brand simulators ? David Pommerenke was born April 11, 1962 in Ann Arbor. He received his diploma in Electrical Engineering in 1989 from the Technical University Berlin. He worked at the same university from 1990 until 1996 as research and teaching assistant in EMC and High Voltage. In 1995 he received his Ph.D. on 'Transient Fields of ESD'. Since August 1996 he's been employed as an EMC Engineer for the HP Roseville site responsible for the test an implementation of new EMC methods. Over the past several years he has published 20 papers on system level ESD, the breakdown process, numerical calculation of ESD, high voltage partial discharge detection systems and on project oriented teaching. Should you need a map, please get in touch with me and I will be happy to send you one. Looking forward to seeing you at the meeting. Kamran Mohajer, Vice-Chair of SCPSTC Sr. Agency Compliance Engineer BABT Deputy Approvals Liaison Engineer N.E.T. (Network Equipment Technologies) 800 Saginaw Drive Redwood City , CA 94063 Tel: 415-780-5365 Fax: 415-780-5004 [email protected]
