For the reliability engineers out there, I am looking for ideas on how to perform a reliability test for a Base Transceiver Subsystem with a predicted MTBF of 16,006 hours. Researching the MIL-HDBK-781 test plans reveals the shortest test time is Test Plan XXID. Test Plan XXID has a test duration of 17,606.6 hours (1.1 X 16,006 hours). This is equivalent to 733 days or 2 years to conduct a reliability test. Plus, Test Plan XXID allows no relevant failures. There has to be a smarter and more cost effective method to perform a reliability test to verify this 16,006-hour MTBF. Any ideas would be greatly appreciated.
Sincerely, Jon K. Ilseng Senior Reliability Engineer Samsung Telecommunications America Richardson, TX [email protected] 972-761-7438
