On 8 April 2015 at 11:06, Przemyslaw Marczak <[email protected]> wrote: > This test introduces new test structure type:dm_test_perdev_uc_pdata. > The structure consists of three int values only. For the test purposes, > three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1. > > This commit adds two test cases for uclass platform data: > - Test: dm_test_autobind_uclass_pdata_alloc - this tests if: > * uclass driver sets: .per_device_platdata_auto_alloc_size field > * the devices's: dev->uclass_platdata is non-NULL > > - Test: dm_test_autobind_uclass_pdata_valid - this tests: > * if the devices's: dev->uclass_platdata is non-NULL > * the structure of type 'dm_test_perdev_uc_pdata' allocated at address > pointed by dev->uclass_platdata. Each structure field, should be equal > to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1. > > Signed-off-by: Przemyslaw Marczak <[email protected]> > Cc: Simon Glass <[email protected]> > --- > Changes V2: > - update test functions with calls: uclass_find_first/next_device() > > Changes V3: > - none > --- > include/dm/test.h | 20 +++++++++++++++++++ > test/dm/core.c | 55 > +++++++++++++++++++++++++++++++++++++++++++++++++++ > test/dm/test-uclass.c | 11 +++++++++++ > 3 files changed, 86 insertions(+)
Acked-by: Simon Glass <[email protected]> _______________________________________________ U-Boot mailing list [email protected] http://lists.denx.de/mailman/listinfo/u-boot
