On 15 April 2015 at 05:07, Przemyslaw Marczak <[email protected]> wrote: > This test introduces new test structure type:dm_test_perdev_uc_pdata. > The structure consists of three int values only. For the test purposes, > three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1. > > This commit adds two test cases for uclass platform data: > - Test: dm_test_autobind_uclass_pdata_alloc - this tests if: > * uclass driver sets: .per_device_platdata_auto_alloc_size field > * the devices's: dev->uclass_platdata is non-NULL > > - Test: dm_test_autobind_uclass_pdata_valid - this tests: > * if the devices's: dev->uclass_platdata is non-NULL > * the structure of type 'dm_test_perdev_uc_pdata' allocated at address > pointed by dev->uclass_platdata. Each structure field, should be equal > to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1. > > Signed-off-by: Przemyslaw Marczak <[email protected]> > Cc: Simon Glass <[email protected]> > Acked-by: Simon Glass <[email protected]> > --- > Changes V2: > - update test functions with calls: uclass_find_first/next_device() > > Changes V3: > - none > > Changes V4: > - add Acked-by
Applied to u-boot-dm, thanks! _______________________________________________ U-Boot mailing list [email protected] http://lists.denx.de/mailman/listinfo/u-boot
