Add sample dm clk test for clk_get_by_index and
clk_get_by_index_nodev functionality code.
Cc: Stephen Warren <swar...@nvidia.com>
Cc: Simon Glass <s...@chromium.org>
Signed-off-by: Jagan Teki <ja...@amarulasolutions.com>
---
test/dm/clk.c | 21 +++++++++++++++++++++
1 file changed, 21 insertions(+)
diff --git a/test/dm/clk.c b/test/dm/clk.c
index 898c034e27..29ef6ef41b 100644
--- a/test/dm/clk.c
+++ b/test/dm/clk.c
@@ -4,12 +4,33 @@
*/
#include <common.h>
+#include <clk.h>
#include <dm.h>
#include <asm/clk.h>
#include <dm/test.h>
#include <linux/err.h>
#include <test/ut.h>
+/* Base test of the clk uclass */
+static int dm_test_clk_base(struct unit_test_state *uts)
+{
+ struct udevice *dev;
+ struct clk clk_method1;
+ struct clk clk_method2;
+
+ /* Get the device using the clk device */
+ ut_assertok(uclass_get_device_by_name(UCLASS_MISC, "clk-test", &dev));
+
+ /* Get the same clk port in 2 different ways and compare */
+ ut_assertok(clk_get_by_index(dev, 1, &clk_method1));
+ ut_assertok(clk_get_by_index_nodev(dev_ofnode(dev), 1, &clk_method2));
+ ut_asserteq(clk_method1.id, clk_method2.id);
+
+ return 0;
+}
+
+DM_TEST(dm_test_clk_base, DM_TESTF_SCAN_FDT);
+
static int dm_test_clk(struct unit_test_state *uts)
{
struct udevice *dev_fixed, *dev_clk, *dev_test;
--
2.18.0.321.gffc6fa0e3
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