On 2026-07-31T00:13:34, Aristo Chen <[email protected]> wrote: > binman: Fix FIT image overlap issues for testFitSplitElf > > testFitSplitElf builds both the ATF and TEE test images from the same > elf_sections binary, so the split-elf nodes generated for the two > images end up with identical load addresses and overlap in memory. An > upcoming commit teaches mkimage to validate whether the memory > regions referenced by a configuration overlap, which makes this test > fail. > > Update the test to use a non-overlapping memory layout so the two > images no longer collide: > > 1. Add elf_sections_tee.lds, which mirrors elf_sections.lds with the > section addresses shifted up by 0x100000 for the TEE image. > 2. Build an elf_sections_tee binary from it in the test Makefile. > 3. Update ftest.py to use the separate ELF file for the TEE component > in split-elf operations. > > Signed-off-by: Aristo Chen <[email protected]> > > tools/binman/ftest.py | 2 +- > tools/binman/test/Makefile | 8 ++++++-- > tools/binman/test/elf_sections_tee.c | 1 + > tools/binman/test/elf_sections_tee.lds | 35 > ++++++++++++++++++++++++++++++++++ > 4 files changed, 43 insertions(+), 3 deletions(-)
Reviewed-by: Simon Glass <[email protected]>
