Dave in comment #10 you said "load on the ARM during transfers (my hunch
is, if anything is affected, it'll be the latter - I vaguely recall
forum posts about improvements on the ARM load during large USB
transactions)." Were the systems checked for load during the transfer
tests?

Additionally, would it be worthwhile to test different versions of USB
media?  I'd really hate to be caught off guard by something.

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https://bugs.launchpad.net/bugs/1852510

Title:
  IO errors when writing large amounts of data to USB storage in eoan on
  RPI

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