Mark Kirkwood wrote on 21/05/06 07:30:
>> On May 20, 2006, at 7:56 PM, Dave Jones wrote:
>>> I've implemented the hddtemp service, and see that my HDs, one an IBM
>>> 120GB, the other a Hitachi 120GB disk, run a steady 46 and 49 degrees C.

>> When you touch them, does it feel about right.  While it is warm, it
>> is not that warm that you couldn't make a guess if it was right or not
>> and you shouldn't hurt yourself.  The reason I mention it is to have a
>> second opinion if hddtemp is working correctly in your installation.

>> I have not run hddtemp but have run some vendor utilities from hitachi
>> and they gave bogus info back on HD temp

> The fact that both the IBM and Hitachi drives are recording similar
> temperatures suggests that hddtemp is probably reading them correctly.

> You could emerge smartmontools, and see if its temperature readings
> agree with hddtemp (they should).

--------------

I was told that Hitachi took over the manufacture of IBM HDs a few years
ago, and that IBM no longer deliver their own brand ATA HDs.   Can
anyone confirm if this is true?   When I ordered a second IBM HD to
match my original IBM 120 GB HD, I received a Hitachi disk instead.

Maybe the IBM disk temperature readings are bogus, like the Hitachi?

I've emerged smartmontools, the temperature readings it gives agree with
hddtemp.

smartmonctl -a /dev/hdb gives the results below, which looks bad to me.
 I'd guess that my Hitachi second HD is heading for the great /dev/null.

I don't have a thermometer in the house at the moment, but the HD's feel
warm, not terribly hot, certainly not too uncomfortable to touch.

Any recommendations for cool-running ATA HDs, preferably with a capacity
of around 250 GB?

Definitely backup time here though!

Cheers, Dave

(Please excuse the following long listing)

---------------------------


smartctl version 5.33 [i686-pc-linux-gnu] Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     IC35L120AVV207-0
Serial Number:    VNVD03G4GDLX4P
Firmware Version: V24OA63A
User Capacity:    123,522,416,640 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   6
ATA Standard is:  ATA/ATAPI-6 T13 1410D revision 3a
Local Time is:    Sun May 21 18:13:13 2006 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection:
Disabled.
Self-test execution status:      (   0) The previous self-test routine
completed
                                        without error or no self-test
has ever
                                        been run.
Total time to complete Offline
data collection:                 (2855) seconds.
Offline data collection
capabilities:                    (0x1b) SMART execute Offline immediate.
                                        Auto Offline data collection
on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        No Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   1) minutes.
Extended self-test routine
recommended polling time:        (  48) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE
UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   095   095   060    Pre-fail  Always
      -       589825
  2 Throughput_Performance  0x0005   100   100   050    Pre-fail
Offline      -       0
  3 Spin_Up_Time            0x0007   098   098   024    Pre-fail  Always
      -       266 (Average 293)
  4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always
      -       2310
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always
      -       1
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always
      -       0
  8 Seek_Time_Performance   0x0005   100   100   020    Pre-fail
Offline      -       0
  9 Power_On_Hours          0x0012   099   099   000    Old_age   Always
      -       13573
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always
      -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always
      -       891
192 Power-Off_Retract_Count 0x0032   098   098   050    Old_age   Always
      -       2800
193 Load_Cycle_Count        0x0012   098   098   050    Old_age   Always
      -       2800
194 Temperature_Celsius     0x0002   107   107   000    Old_age   Always
      -       51 (Lifetime Min/Max 11/62)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always
      -       1
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always
      -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age
Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always
      -       0

SMART Error Log Version: 1
ATA Error Count: 31 (device log contains only the most recent five errors)
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 31 occurred at disk power-on lifetime: 3448 hours (143 days + 16
hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 01 d2 27 93 f1  Error: UNC 1 sectors at LBA = 0x019327d2 = 26421202

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 01 d2 27 93 f1 00      01:45:54.100  READ DMA
  ca 00 01 1f 30 00 f0 00      01:45:54.100  WRITE DMA
  ca 00 01 5f 00 00 f0 00      01:45:54.100  WRITE DMA
  ca 00 01 3f 00 00 f0 00      01:45:54.100  WRITE DMA
  c8 00 01 00 00 00 f0 00      01:45:54.100  READ DMA

Error 30 occurred at disk power-on lifetime: 3448 hours (143 days + 16
hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 01 d2 27 93 f1  Error: UNC 1 sectors at LBA = 0x019327d2 = 26421202

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 01 d2 27 93 f1 00      01:45:49.100  READ DMA
  ca 00 01 1f 30 00 f0 00      01:45:49.100  WRITE DMA
  ca 00 01 5f 00 00 f0 00      01:45:49.100  WRITE DMA
  c8 00 01 00 00 00 f0 00      01:45:49.100  READ DMA
  ca 00 01 3f 00 00 f0 00      01:45:49.100  WRITE DMA

Error 29 occurred at disk power-on lifetime: 3448 hours (143 days + 16
hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 01 d2 27 93 f1  Error: UNC 1 sectors at LBA = 0x019327d2 = 26421202

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 01 d2 27 93 f1 00      01:45:44.100  READ DMA
  ca 00 01 1f 30 00 f0 00      01:45:44.100  WRITE DMA
  ca 00 01 5f 00 00 f0 00      01:45:44.100  WRITE DMA
  ca 00 01 3f 00 00 f0 00      01:45:44.100  WRITE DMA
  c8 00 01 00 00 00 f0 00      01:45:44.100  READ DMA

Error 28 occurred at disk power-on lifetime: 3448 hours (143 days + 16
hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 01 d2 27 93 f1  Error: UNC 1 sectors at LBA = 0x019327d2 = 26421202

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 01 d2 27 93 f1 00      01:45:39.100  READ DMA
  ca 00 01 1f 30 00 f0 00      01:45:39.100  WRITE DMA
  ca 00 01 5f 00 00 f0 00      01:45:39.100  WRITE DMA
  c8 00 01 00 00 00 f0 00      01:45:39.100  READ DMA
  ca 00 01 3f 00 00 f0 00      01:45:39.100  WRITE DMA

Error 27 occurred at disk power-on lifetime: 3448 hours (143 days + 16
hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 01 d2 27 93 f1  Error: UNC 1 sectors at LBA = 0x019327d2 = 26421202

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 01 d2 27 93 f1 00      01:45:34.100  READ DMA
  ca 00 01 1f 30 00 f0 00      01:45:34.100  WRITE DMA
  ca 00 01 5f 00 00 f0 00      01:45:34.100  WRITE DMA
  ca 00 01 3f 00 00 f0 00      01:45:34.100  WRITE DMA
  c8 00 01 00 00 00 f0 00      01:45:34.100  READ DMA

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Device does not support Selective Self Tests/Logging

------------
-- 
gentoo-user@gentoo.org mailing list

Reply via email to