Hello Peter. Thank you very much. I will do so and check it. I find this
mailing list very useful - a lot of useful informations from kind people
that like to share - thank you!

Best regards,

Łukasz Kruszewski


> If you switch from GUI mode to launch mode and perform refinement, you
> will
> see correlation matrix at the end of .inp file and can tell which
> parameters correlate a lot and figure out what's causing such large error.
> I also think that this error is not strange for such large cryst.size as
> it
> is basically beyond the limt of the methods.
> Peter
>
> ....................................................................
> Dr. Peter Y. Zavalij
> Director - X-ray Crystallographic Center
> University of Maryland, College Park, MD 20832
>
> On Wed, Jul 27, 2016 at 1:07 PM, "Łukasz Kruszewski" <
> lkruszew...@twarda.pan.pl> wrote:
>
>> Hello James. I just read the error that is reported for each refined
>> parameter in TOPAS. I obtain value like, e.g., 9000 nm, and the error
>> is,
>> e.g., 205006.
>>
>> Best regards,
>>
>> Łukasz Kruszewski
>>
>>
>> > By what metric are you determining that the CrySize value is in error?
>> >
>> >
>> > James P. Cline
>> > Materials Measurement Science Division
>> > National Institute of Standards and Technology
>> > 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ]
>> > Gaithersburg, MD 20899-8523    USA
>> > jcl...@nist.gov
>> > (301) 975 5793
>> > FAX (301) 975 5334
>> >
>> > -----Original Message-----
>> > From: rietveld_l-requ...@ill.fr [mailto:rietveld_l-requ...@ill.fr] On
>> > Behalf Of "Lukasz Kruszewski"
>> > Sent: Wednesday, July 27, 2016 10:22 AM
>> > To: rietveld_l@ill.fr
>> > Subject: CrySize error in TOPAS
>> >
>> > Dera friends,
>> >
>> > I'm doing Rietveld refinements in TOPAS; I get rather good fit of the
>> > reflections, rather good wt.%, but I've observed large errors for the
>> > CrySize (Lorentzian) values for some introduced Structures. I've tried
>> to
>> > change it by refining CrySize (Gaussian), but it only changed in few
>> > particular cases. I'm rather sure that the intrumental parameters
>> > (geometry of the diffractometer was analyzed with the use of LaB6, Si,
>> and
>> > other standards) and corrections (sample displ. etc.) are OK and I
>> suppose
>> > these factors shouldn't influence (?) the CrySize values. I always
>> > constrain the minimum (20 starting value) and maximum (10000 nm) value
>> for
>> > CrySize; I usually refine strain, but I've noticed that it doesn't
>> > influence the results (at least the wt.% calculated). Rwp, goodness of
>> fit
>> > and Durbin-Watson statistics R values are OK; also, the calculated
>> > background line is "flat", i.e., there is no mistaking of the
>> background
>> > with reflections; the shapes of the reflections in the calculated
>> > diffractograms seem to be OK, too. I was thus wondering if these high
>> > errors coming from the CrySize are that important for the refinement?
>> >
>> > Best regards,
>> >
>> >
>> > --
>> > Łukasz Kruszewski, Ph.D., adjunct
>> > Polish Academy of Sciences
>> > Institute of Geological Sciences
>> > Twarda 51/55 str.
>> > 00-818 Warsaw
>> > Poland
>> >
>>
>>
>> --
>> Łukasz Kruszewski, Ph.D., adjunct
>> Polish Academy of Sciences
>> Institute of Geological Sciences
>> Twarda 51/55 str.
>> 00-818 Warsaw
>> Poland
>>
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-- 
Łukasz Kruszewski, Ph.D., adjunct
Polish Academy of Sciences
Institute of Geological Sciences
Twarda 51/55 str.
00-818 Warsaw
Poland
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The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/
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