Dear Rietveld users,
Thank you very much for all your responses, it will help us move forward
on the subject.
Unfortunately, I cannot say more because of an NDA.
But it still looks very interesting from a fundamental point of view.
Best whishes, françois Goutenoire
Le 03/03/2021 à 18:47, Mendenhall, Marcus H. (Fed) a écrit :
Is it really amorphous content, or is there a whole bunch of very fine
nanocrystalline stuff or material with a very high defect density that is
widening the peak? If the fitter is having trouble matching the peak shape, it
may be ascribing a fairly arbitrary portion between amorphous and crystalline.
Marcus Mendenhall
Materials Measurement Science Division
National Institute of Science and Technology
100 Bureau Dr. stop 8370 (217/B115)
Gaithersburg, MD 20899 USA
Phone: +1-301-975-8631
during COVID-19 response period:
Home phone: 301-916-5486
Cell: 615-293-3120
On Mar 3, 2021, at 7:34 AM, François Goutenoire
<francois.gouteno...@univ-lemans.fr> wrote:
Dear Rietveld users,
I have some industrial compound presenting a strong hyper-Lorentzian peak shape
(eta=1.1 with HighScore). When we calculate the amorphous content after an
internal standard addition, the result is 40%. The micro-absorption effect has
been minimized (mu of the internal standard is closed to the compound).
But with some electronic transmission analysis no amorphous is observed.
The question is : Does a strong hyper-Lorentzian peak shape could influence
quantitative analysis ?
François
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Pr. Francois GOUTENOIRE
e-mail: francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Skype Entreprise visio conférence
Département des Oxydes et Fluorures
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Formation Rietveld CNRS 2020
https://gcc02.safelinks.protection.outlook.com/?url=https%3A%2F%2Fcnrsformation.cnrs.fr%2Fdiffraction-des-rayons-x-sur-materiaux-polycristallins%3Faxe%3D135&data=04%7C01%7Cmarcus.mendenhall%40nist.gov%7C6e1cde8aec7f4b0a22f908d8de40e15f%7C2ab5d82fd8fa4797a93e054655c61dec%7C1%7C0%7C637503717543667809%7CUnknown%7CTWFpbGZsb3d8eyJWIjoiMC4wLjAwMDAiLCJQIjoiV2luMzIiLCJBTiI6Ik1haWwiLCJXVCI6Mn0%3D%7C3000&sdata=9gZI92veVdDCLrWYKl0yrXubDMwEUmE25mlMINC6DYo%3D&reserved=0
Formation EDX CNRS 2020
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Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
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Bibliographie
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--
*********************************************************************************************
Pr. Francois GOUTENOIRE
e-mail: francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Skype Entreprise visio conférence
Département des Oxydes et Fluorures
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*********************************************************************************************
Formation Rietveld CNRS 2020
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS 2020
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4AAAAJ&view_op=list_works&authuser=1&sortby=title
https://orcid.org/0000-0001-5339-3002
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
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