an actual RR on amourphous contents like thos on crystalline mixtureswould really be appriciable, i don't know any publications therewith. The problem seems to exist as can be seen here, but also with internal standard method, as in personal discussions the question on achieved negative amorphous contents (internal as well as external standard method) arises from time to time. And not alway this can be solved just by variation of background polynoms or other structure related parameters.

So if "anyone" would initiate such a RR i would like to join it ....

Holger

Am 14.04.2022 um 09:49 schrieb Julian Richard Tolchard:

I confess that this discussion seems to validate my personal choice to treat Rietveld quantification (and especially amorphous quant) as something lying between a quantificational and semi-quantificational technique.

Has anyone done a proper round-robin on amorphous quant (by any methods actually)? There have been some RR’s for crystalline mixtures I know, but I can’t remember seeing one for crystalline+amorphous samples.

jools

*From:*rietveld_l-requ...@ill.fr <rietveld_l-requ...@ill.fr> *On Behalf Of *Matthew Rowles
*Sent:* torsdag 14. april 2022 09:03
*To:* Jonathan WRIGHT <wri...@esrf.fr>
*Cc:* RIETVELD_L Distribution List <rietveld_l@ill.fr>
*Subject:* Re: NIST SRM656 Analysis

Hi Jon

The data is put on an absolute scale through the external standard approach. The calculations assume that the QPA for corundum in NIST SRSM676a is 99.02 wt%. This scaling factor is then applied to the silicon nitride pattern.

re surface roughness: The samples were backpacked against a glass surface, and the powders used as-received. I've never measured the particle size distribution of either (any!) SRM, but the certificates describe 676a as "fully disaggregated" and "grains are sub-micrometer in size and equi-axial in shape" and the 656 certificate has a particle size distribution by laser scattering, with 100% less than 5 um. In our other work, we aim to micronise to less than 10 um. Our grinding checks show that we get 100 vol% <15 um and 95 vol% <6 um.

I've never used the Pitschke or Suortti roughness corrections available in Topas, and have no intuition as to the magnitude of their correction or what "proper" values should be.

Matthew

On Wed, 13 Apr 2022 at 18:11, Jonathan WRIGHT <wri...@esrf.fr> wrote:

    Maybe a silly question: are you assuming you have the data on an
    absolute scale
    in order to do these calculations? Do things like surface
    roughness somehow not
    matter?

    Best

    Jon




    On 13/04/2022 11:56, Matthew Rowles wrote:
    > Thanks Tony
    >
    > When I add the absorption edge correction to the silicon nitride
    model (and add
    > beta-silicon nitride), it becomes -2.8 wt% amorphous; up a
    little due to the
    > added correction and down a little due to the extra phase.
    >
    > If I change your al-SN thermals from 1 to those given in
    ICSD 77811, I get +4.8
    > wt% amorphous. Your atoms were already neutral, so I left them
    as-is.
    >
    > If I make all the Si-nitride phases' thermal parameters == 0,
    then I can get up
    > to 8.5 wt% amorphous.
    >
    > In all of this, corundum is staying as charged atoms, with Al
    and O beqs fixed
    > at 0.334 and 0.278.
    >
    > I'll have to have a go at applying the absorption edge
    correction; I always
    > forget which parameter is which thing and have to rederive my
    understanding of
    > it everytime...
    >
    >
    > Thanks
    >
    > Matthew
    >
    > On Wed, 13 Apr 2022 at 13:58, iangie <ian...@126.com
    <mailto:ian...@126.com>> wrote:
    >
    >     Dear Matthew,
    >
    >     I tried your data and get ~-1% amorphous. My .pro is in
    below link.
    >
    > https://www.dropbox.com/s/xuw13c91l9gq5m5/ROW.pro?dl=0
    
<https://eur03.safelinks.protection.outlook.com/?url=https%3A%2F%2Fwww.dropbox.com%2Fs%2Fxuw13c91l9gq5m5%2FROW.pro%3Fdl%3D0&data=04%7C01%7Cjulianrichard.tolchard%40sintef.no%7Ced6d59fce55f4454e6a408da1de54221%7Ce1f00f39604145b0b309e0210d8b32af%7C1%7C0%7C637855168216257549%7CUnknown%7CTWFpbGZsb3d8eyJWIjoiMC4wLjAwMDAiLCJQIjoiV2luMzIiLCJBTiI6Ik1haWwiLCJXVCI6Mn0%3D%7C3000&sdata=fQatqp0bH0nfkYmTd8bWQkEALCntqGFYjYoSOXMt5ng%3D&reserved=0>
    >     <https://www.dropbox.com/s/xuw13c91l9gq5m5/ROW.pro?dl=0
    
<https://eur03.safelinks.protection.outlook.com/?url=https%3A%2F%2Fwww.dropbox.com%2Fs%2Fxuw13c91l9gq5m5%2FROW.pro%3Fdl%3D0&data=04%7C01%7Cjulianrichard.tolchard%40sintef.no%7Ced6d59fce55f4454e6a408da1de54221%7Ce1f00f39604145b0b309e0210d8b32af%7C1%7C0%7C637855168216267509%7CUnknown%7CTWFpbGZsb3d8eyJWIjoiMC4wLjAwMDAiLCJQIjoiV2luMzIiLCJBTiI6Ik1haWwiLCJXVCI6Mn0%3D%7C3000&sdata=5LLaS0ghYvZKqLDm%2FSkFKRH6ltta7LOvKEb84CZnD8A%3D&reserved=0>>
    >
    >     I normally do not refine Beq, which I believe gives biggest
    source of error
    >     in QPA...
    >
    >
    >     Cheers!
    >
    >     --
    >
    >     *Dr. Xiaodong (Tony) Wang*
    >     *Senior Research Infrastructure Specialist (XRD)*
    >     Central Analytical Research Facility (CARF)   | Queensland
    University of
    >     Technology
    >     *Address:* Level 6, P Block, Gardens Point campus, 2 George
    St Brisbane QLD 4000
    >     *Tel:*+61 7 3138 1904  | *Mob:*0452 571 680
    >     *Email:* tony <mailto:stephen.blank...@qut.edu.au>.
    >     <mailto:stephen.blank...@qut.edu.au>w...@qut.edu.au
    >     <mailto:stephen.blank...@qut.edu.au>   | *Web:*
    www.qut.edu.au/ife/carf
    
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    >     <http://www.qut.edu.au/ife/carf
    
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    >
    >
    >     At 2022-04-13 13:00:44, "Matthew Rowles" <rowle...@gmail.com
    >     <mailto:rowle...@gmail.com>> wrote:
    >
    >         Hi all
    >
    >         Thanks to those that have replied off-list.
    >
    >         I've managed to jiggle things around and get various
    answers. If you
    >         want an answer between -14 and +6 wt% amorphous, I can
    make it happen. I
    >         can either use charged atoms or not, or use thermal
    parameters or not.
    >         Combining those between the corundum and Si3N4, you get
    the following:
    >
    >
    >         image.png
    >         This is using the scattering factors defined with 11
    gaussians.
    >
    >         If you use the ones defined by 9 gaussians, you get
    >         image.png
    >
    >         The structures I used are below. In the certificate for
    656, the
    >         structures are referenced, but those structures have no
    thermal
    >         parameters. Does anyone know what was used in the NIST
    determination?
    >
    >
    >
    >         phase_name "Aluminium_oxide_alpha_10425_icsd"
    >         Hexagonal( 4.759355, 12.99231)
    >         space_group "R -3 c H"
    >         site Al1 num_posns  12x 0      y 0 z 0.14772 occ Al+3 1.
    beq  0.318
    >         site O1  num_posns  18x 0.3064 y 0 z 0.25 occ O-2  1.
    beq  0.334
    >
    >         phase_name "ALPHA_Marchand_ICSD_26191"
    >         Hexagonal( 7.75411, 5.62034)
    >         space_group "P31c" 'atom positions from Marchand.
    Thermals from ICSD 77811
    >         site Si1 num_posns  6x 0.0806 y 0.5095 z 0.3020 occ Si+4
    1   beq 0.25
    >         site Si2 num_posns  6x 0.1675 y 0.2560 z 0.0070 occ Si+4
    1   beq 0.29
    >         site N1  num_posns  2x 0      y 0      z 0   occ N   
    1.  beq 0.88
    >         site N2  num_posns  2x =1/3;  y =2/3;  z 0.3500 occ N   
    1.  beq 0.46
    >         site N3  num_posns  6x 0.0390 y 0.3860 z 0.0310 occ N   
    1.  beq 1.06
    >         site N4  num_posns  6x 0.3190 y 0.3210 z 0.2660 occ N   
    1.  beq 0.17
    >
    >         phase_name "BETA_Billy_ICSD_35566"
    >         Hexagonal( 7.60633, 2.90778)
    >         space_group "P 63/m" ' structure from Billy, thermals
    from ICSD 170004
    >         site Si1 num_posns  6x 0.2323 y 0.4096 z 0.25 occ Si+4 
     1  beq 0.231
    >         site N1  num_posns  2x =1/3;  y =2/3;  z 0.25 occ N     
    1  beq 0.326
    >         site N2  num_posns  6x 0.3337 y 0.0323 z 0.25 occ N     
    1  beq 0.314
    >
    >
    >
    >
    >
    >
    >         On Tue, 12 Apr 2022 at 17:13, Matthew Rowles
    <rowle...@gmail.com
    >         <mailto:rowle...@gmail.com>> wrote:
    >
    >             Hi all
    >
    >             I've collected some more data, and am still getting
    spurious
    >             results, and by spurious, I mean -5 wt% amorphous in
    SRM-alpha-656
    >             when quantified by the external method against SRM 676a.
    >
    >             We had some SRM-656alpha (couldn't find any of the
    beta) stored in a
    >             drying oven, and some SRM676a stored in a cupboard.
    I collected some
    >             data using a D8 with Ni-filtered Cu and a lynx-eye
    detector (0.25°
    >             fixed divergence, 250 mm radius, 2x2.5° sollers).
    The patterns were
    >             collected consecutively (using the same program),
    with a single peak
    >             from SRM1976 (b, I think), acting as an intensity
    calibrant (the
    >             intensity didn't appreciably change), collected
    before, after, and
    >             between.
    >
    >             Does anybody want to have a look at the data and see
    what I'm doing
    >             wrong? Data available at:
    >
    
https://raw.githubusercontent.com/rowlesmr/pdCIFplotter/changing-str-to-float-conversion/data/row_Cu_676a.xy
    
<https://eur03.safelinks.protection.outlook.com/?url=https%3A%2F%2Fraw.githubusercontent.com%2Frowlesmr%2FpdCIFplotter%2Fchanging-str-to-float-conversion%2Fdata%2Frow_Cu_676a.xy&data=04%7C01%7Cjulianrichard.tolchard%40sintef.no%7Ced6d59fce55f4454e6a408da1de54221%7Ce1f00f39604145b0b309e0210d8b32af%7C1%7C0%7C637855168216277469%7CUnknown%7CTWFpbGZsb3d8eyJWIjoiMC4wLjAwMDAiLCJQIjoiV2luMzIiLCJBTiI6Ik1haWwiLCJXVCI6Mn0%3D%7C3000&sdata=bpmDTHBfC%2BxKNGENBr1Xw4lYUhVLOxqdvi7pzNv9L6g%3D&reserved=0>
    >           
     
<https://raw.githubusercontent.com/rowlesmr/pdCIFplotter/changing-str-to-float-conversion/data/row_Cu_676a.xy
    
<https://eur03.safelinks.protection.outlook.com/?url=https%3A%2F%2Fraw.githubusercontent.com%2Frowlesmr%2FpdCIFplotter%2Fchanging-str-to-float-conversion%2Fdata%2Frow_Cu_676a.xy&data=04%7C01%7Cjulianrichard.tolchard%40sintef.no%7Ced6d59fce55f4454e6a408da1de54221%7Ce1f00f39604145b0b309e0210d8b32af%7C1%7C0%7C637855168216287428%7CUnknown%7CTWFpbGZsb3d8eyJWIjoiMC4wLjAwMDAiLCJQIjoiV2luMzIiLCJBTiI6Ik1haWwiLCJXVCI6Mn0%3D%7C3000&sdata=1yKQm%2Ftpm6Wz06p2gvWcFYWTcu1G%2Bc1dbzSQxaQDSuo%3D&reserved=0>>
    >
    >
    
https://raw.githubusercontent.com/rowlesmr/pdCIFplotter/changing-str-to-float-conversion/data/row_Cu_al656.xy
    
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    >           
     
<https://raw.githubusercontent.com/rowlesmr/pdCIFplotter/changing-str-to-float-conversion/data/row_Cu_al656.xy
    
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    >
    >
    >             Thanks
    >
    >             Matthew
    >
    >
    >
    >
    >
    >             On Wed, 16 Mar 2022 at 21:13, Matthew Rowles
    <rowle...@gmail.com
    >             <mailto:rowle...@gmail.com>> wrote:
    >
    >                 Hi List People
    >
    >                 Do any of you use NIST SRM656 in your
    quantitative analysis
    >                 quality control?
    >
    >                 I've recently started at a new lab, and am
    finding it impossible
    >                 to make a physically realistic model (in Topas)
    that gives
    >                 results anywhere near correct (or at least,
    close to the
    >                 certificate values).
    >
    >                 As an example, using the external std approach
    with SRM676, I've
    >                 managed to calculate there is -11 wt% amorphous
    in the beta-656
    >                 standard.
    >
    >                 I've tried using the silicon nitride structures
    given in the SRM
    >                 certificate, but the papers and the ICSD entries
    don't list any
    >                 thermal parameters.
    >
    >                 I can get the same results as given on the
    certificate using a
    >                 siroquant model, but I don't know the provenance
    of the HKL
    >                 files used in the analysis.
    >
    >
    >                 Thanks in advance
    >
    >
    >                 Matthew Rowles
    >
    >
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