Requesting for Instrument configuration profile (D8-Bruker-Instruments)

[NAVD A .]

Hi Rietvelder Community Colleagues,

While doing the Rietveld refinement both qualitatively and quantitatively,

the information about the correct instrument configuration file is pivotal and 
inevitable to have a reliable results.


I am wondering whether someone has calculated and characterized the

contributions of the instrument to the diffraction profile with

scan of the NIST line profile 660 LaB6.

If so please share relevant .pro file, that would be quiet helpful.


The instrument details are as under:

D8 Discover

  *   Transmission
 (capillary) geometry

  *   Cu
 radiation source

  *   Johansson
 Monochromator

  *   Slit
 2mm

  *   Axial
 Soller 2.5°
  *   Detector
 LYNXEYE


D8 Advance


  *   Bragg-Brentano
 Geometry
  *   Cu
 radiation source
  *   Motorized
 slit (set to: 0.6mm)
  *   Axial
 Soller 2.5°
  *   Detector
 LYNXEYE_XE_T
  *   Detector
 Optics: Soller 2.5° (Axial Divergence)
  *   Detector
 optics: Slit_Open_2 18mm

 Looking forward to hearing from you.
Regards,
Naveed
_
Dr.rer.nat. Naveed Zafar Ali


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Syntax Error in CHECK CIF Report

[NAVD A .]

Dear Rietvelders.
While checking for Syntax Error in the CHECK CIF generated report,
I encountered an error,
"calculated and reported Z values differ by a factor 2 ratio."
Z=no of Formula unit per Unit cell.
What could be the solid pet reason for that.?
Is this something to do with 'Moeity formula'.
Though the volume and density of both calculated and reported value is the same.
Note: The .CIF file is generated using IUCr friendly Macro in .INP mode of 
TOPAS 5.
Any suggestion or advice will highly be acknowledged.


Regards,

Dr. Naveed Zafar Ali







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Fw: Seeking an economical replacement for a Panalytical XRD high kV power supply

[NAVD A .]

Dear Rietveld Community ,
Prof. Chang Fu Dee from UKM Malaysia has requested for tips /solution in 
resolving the
issue with Power supply of the XRD machine. For detail see the email thread 
below.
We look forward to receiving the expert advice from the Rietveld community.
 Regards,
Dr. Naveed Zafar Ali


-- Forwarded message -
From: Chang-Fu Dee mailto:cf...@ukm.edu.my>>
Date: Mon, Aug 7, 2023 at 7:08 PM
Subject: Seeking an economical replacement for a Panalytical XRD high kV power 
supply
To: Naveed Zafar Ali mailto:naveed...@gmail.com>>


Dear Dr Naveed,


Our school possesses an XRD system, the Xpert Pro PW 3040^60. Unfortunately, 
the power supply of the XRD system is experiencing issues. We are currently 
seeking an economical replacement for this power supply.

We conducted tests on the power supply using a well-functioning X-Ray emission 
head. As a result, we have reasonable confidence that the problem lies within 
the high-power supply unit.

We kindly request assistance in identifying a budget-friendly high kV power 
supply, as specified in the attached document. Your assistance is greatly 
appreciated.

Thank you in advance for your assistance in this matter.


Regards

Dee, Chang Fu
IMEN Research & Innovation Affairs 
Coordinator

[https://docs.google.com/uc?export=download=1kaKywEWqguhJVLyqzlVpxcwyQU-T_Tv1=0BxaW6tVaXGBQYld6aXZ2Y0hzSEVLQXlDYmc4Q2ZNREZiWDdzPQ]
 
[https://docs.google.com/uc?export=download=1GjXeoQ3VXAACzl_oQ36E4FXgA06hruuH=0BxaW6tVaXGBQcE9xM0dneTNVSEo4V3VjVVVLcmNjQUJNRUpZPQ]
 
Institute of Microengineering and Nanoelectronics (IMEN)
Level 4, Research Complex,
Universiti Kebangsaan Malaysia (National University of Malaysia, UKM),
43600 Bangi, Selangor, Malaysia
Tel: +603-89118546 Mobile: +6012-4113273
Email: cf...@ukm.edu.my / 
deechan...@gmail.com
Website  : https://sites.google.com/site/deechangfu  http://www.ukm.edu.my/cfdee

Google 
Scholar: https://scholar.google.com/citations?user=gf4brpQJ=en
Scopus Research ID: 22633648400: 
http://www.scopus.com/authid/detail.url?authorId=22633648400
Research Gate: https://www.researchgate.net/profile/Chang_Fu_Dee/
Thomson Web of Science Researcher ID: B-2806-2009: 
http://www.researcherid.com/rid/B-2806-2009
ORCID:  http://orcid.org/-0003-1015-9181



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Multicomponent quantitative Rietveld analysis of Mineralogical Samples-Any Expert

[NAVD A .]

Dear Rietveld Community ,
I am in interested in using  rietveld analysis (using TOPAS .INP files) of PXRD 
data for multicomponent quantitative analysis within the bulk Mineral samples 
-% phase data Analysis of following samples.
1-Barite
2-Lepidolite: A lithium-rich mica mineral
3-Spodumene, a lithium aluminum silicate mineral
4-Beryl

Anyone having experience of working with these or relevant minerals, or is 
involved in respective rietveld analysis of %age phase quantification of these 
samples , please share your experience of doing multicomponent Rietveld 
analysis technique for minerals Analysis
particularly with disordered structures.. I cannot find anything in Durham 
Topas Wiki portal.

Regards,
Dr.rer.nat. Naveed Zafar Ali
Principal Scientist
National Centre for Physics (NCP),
​​___



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