Aloha!
Leichter, Jerry skrev:
So presumably the model is: Put each manufactured chip into a testing
device that repeatedly power cycles it and reads all of memory. By
simply comparing values on multiple cycles, it assigns locations to
Class 1 or 2 (or 3, if you like). Once you've done this
Aloha!
Peter Gutmann skrev:
So RAM state is entropy chicken soup, you may as well use it because it can't
make things any worse, but I wouldn't trust it as the sole source of entropy.
Ok, apart from the problems with reliable entropy generation. I'm I
right when I get a bad feeling when I
On Tue, 18 Sep 2007, James A. Donald wrote:
Using SRAM as a source of either randomness or unique
device ID is fragile. It might well work, but one
cannot know with any great confidence that it is going
to work. It might work fine for every device for a
year, and then next batch arrives, and
On Mon, 17 Sep 2007 11:20:32 -0700
Netsecurity [EMAIL PROTECTED] wrote:
Back in the late 60's I was playing with audio and a magazine I
subscribed to had a circut for creating warble tones for standing
wave and room resonance testing.
The relevance of this is that they were using a random
Netsecurity wrote:
Back in the late 60's I was playing with audio and a
magazine I subscribed to had a circuit for creating
warble tones for standing wave and room resonance
testing.
The relevance of this is that they were using a
random noise generating chip that they acknowledged
was
Udhay Shankar N [EMAIL PROTECTED] writes:
Sounds like an interesting idea - using SRAM state as a source of randomness.
Any of the folks here willing to comment on this?
The paper actually covers two (related) things, fingerprint extraction and
using SRAM power-up state as a random number source
Aloha!
Peter Gutmann skrev:
The worst case is a change in the environment or manufacturing process, which
typically occurs without the end user even knowing about it. You simply can't
guarantee anything about RAM state as an RNG source, you'd have to prove a
negative (no change in
On Sep 12, 2007, at 7:06 AM, Udhay Shankar N wrote:
Sounds like an interesting idea - using SRAM state as a source of
randomness. Any of the folks here willing to comment on this?
If you care about your randomness, you don't want to be making the
assumption that a source is random because
Hi.
On Sun, 16 Sep 2007, Joachim Strmbergson wrote:
One could add test functionality that checks the randomness of the
initial SRAM state after power on. But somehow I don't think a good test
suite and extremely low cost devices (for example RFID chips) are very
compatible concepts.
One can
Aloha!
Udhay Shankar N skrev:
Sounds like an interesting idea - using SRAM state as a source of
randomness. Any of the folks here willing to comment on this?
Udhay
http://prisms.cs.umass.edu/~kevinfu/papers/holcomb-FERNS-RFIDSec07.pdf
IMHO a very interesting paper.
But I have a few
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