Dear Lena, I'm sorry but I never used it, maybe someone else can
answer on this issue...
all the best
Palma

2012/5/31 Mandl, Magdalena <magdalena.ma...@isc.fraunhofer.de>:
> Dear Palma,
>
> thanks for your help! I have some more questions:
> Do you use the PSDF Function to verify the roughness an waviness Parameters?
> Do you know if it is possible to determine the Cut-off frequency out of the 
> PSDF Function?
> How can I make out of the vertical PSDF and the horizontal PSDF one PSD 
> Function?
>
> All the best
> Lena
>
> -----Ursprüngliche Nachricht-----
> Von: Palma D'Antonio [mailto:p.danto...@unifg.it]
> Gesendet: Freitag, 25. Mai 2012 15:45
> An: Gwyddion use discussion
> Betreff: Re: [Gwyddion-users] roughness parameters
>
> Dear Lena, I'll try to answer to your questions, even if after having a look 
> to Petr's works, I'm sure he could do it better...
> About value of the cut-off wavelength , times ago I asked the same thing to 
> Yeti, who patiently explained me that it is equal to 2 Δ / C, where  "Δ is 
> the lateral distance between the neighbour points in the profile (and this 
> happens to be the same as the pixel size)" and C is the cut-off frequency 
> value you select on gwyddion.
> Filtering the height data in order to obtain a filtered profile on which 
> calculate the roughness parameters is the usual procedure in surface 
> metrology, you can find a lot of information on it both in internet or in any 
> metrology handbook. After the choice of your cut-off value you can visualize 
> a texture profile (your raw data, which never change selecting the cut-off 
> values), the waviness profile (that is the profile that is subtracted from 
> the raw data by the filtering
> procedure) and the roughness profile (the result of the filtering procedure 
> on which the roughnnes parameters are computed). All this profile are still 
> height data, original or filtered.
> I'm sorry, but I never use the 'line thickness', maybe someone else can 
> answer it.
> I've not understand what 'interpolation' you mean...
>
> I'm quite new in metrology field.. I hope to have been quite precise..
> Palma
>
>
> 2012/5/24 Mandl, Magdalena <magdalena.ma...@isc.fraunhofer.de>:
>> Dear Palma,
>>
>> I´ve red an older input from you and it seems you´ve had kind of the same 
>> questions.
>> I don´t understand the filtering:
>>
>> So first my data is digitalized with an DFT. How can I imagine that? What 
>> happens with my data? Before DFT I have a line with measuring points 
>> equating hights. Then the DFT is done. What do I have then? The graph of the 
>> texture in the ISO button, is it already with DFT?
>> What are the axes in those graphs in the ISO button?
>> After the DFT I select a Cut-off frequency. How can I calculate from it the 
>> cut-off wavelength, which is used in other programs and in the ISO Norm?
>> How does the thickness of the measuring line affect the DFT respectively the 
>> Cut-off frequency?
>> With the Cut-off frequency a Gaussian filter is used. How can I imagine 
>> that? What happens with my data?
>> And last but not least: what interpolation should I choose?
>>
>> -----Ursprüngliche Nachricht-----
>> Von: Palma D'Antonio [mailto:p.danto...@unifg.it]
>> Gesendet: Donnerstag, 17. Mai 2012 11:29
>> An: Gwyddion use discussion
>> Betreff: Re: [Gwyddion-users] roughness parameters
>>
>> Dear Lena, excuse for my delay in answering, I think that the only way to 
>> compare different roughness values is to use the same cut-off frequency, 
>> indeed if the samples are similar they will require the same cut-off... if 
>> they are so deeply different, maybe it sould not be the case to compare 
>> them...
>> anyway remember that the filtering operation is a selection of the surface 
>> features you want to characterize and you can roughly control it by looking 
>> at the variation of the gwyddion roughness profile while changing the 
>> cut-off value. I have a more accurate method to selct the cut-off value but 
>> I'm still working on it.
>> I hope to have been helpful
>> Palma.
>>
>> 2012/5/9 Mandl, Magdalena <magdalena.ma...@isc.fraunhofer.de>:
>>> Dear Palma,
>>>
>>> thank you for your help! I tried a bit to calculate the roughness with 
>>> gwyddion and so far it works good. I have one more question:
>>> Do I have to select always the same Cut-off to compare the results of 
>>> different samples? Or do I select one cut-off per sample? Or can I change 
>>> the cut-off in every line-scan?
>>>
>>> Best regards
>>> Lena
>>>
>>> -----Ursprüngliche Nachricht-----
>>> Von: Palma D'Antonio [mailto:p.danto...@unifg.it]
>>> Gesendet: Dienstag, 14. Februar 2012 09:50
>>> An: Gwyddion use discussion
>>> Betreff: Re: [Gwyddion-users] roughness parameters
>>>
>>> Dear Lena and Luis, I'd like to add something about the issue.
>>> If I'll wrong about, someone will gently correct me.
>>>
>>> 1- when you use the 'ISO' button e select a cut-off, Gwyddion automatically 
>>> filter your data (I think it digitalizes the data, makes a 
>>> DiscreteFourierTransform and applies a gaussian filter ... or something 
>>> similar). Larger the cut-off selected more data are filtered.
>>> The first two or three cut-off values just correct your data for the main 
>>> profile shape (plane, circular, etc..). So I don't think you have to do 
>>> anything before. You can verify it directly, selecting different cut-off 
>>> values and looking at the 'texture' and 'waviness' profiles, that have been 
>>> eliminating, and the roughness profile, on which gwyddion compute the 
>>> roughness parameters.
>>>
>>> 2- I agree with Luis: it depends on the features size. In order to 
>>> characterize some surface features you have to be sure to select a scan 
>>> step suitable to make a good sampling of your object (Nyquist problem). At 
>>> the same time you have to select a scan area that includes a lot of 
>>> singular features (that is, it should be 20 or 30 times the linear 
>>> dimension of the features you are interested to). If your roughness and 
>>> waviness features have very different sizes, maybe you have to make two 
>>> different scannings. Those consideration are deeply handled in metrology 
>>> handbooks. Besides, the size-dependence of your roughness parameters is 
>>> nearly eliminated through this filtering procedure.
>>>
>>> I hope to have been helpful,
>>> regards
>>> Palma.
>>>
>>>
>>> 2012/2/13 luis vazquez <l...@icmm.csic.es>:
>>>> Dear Lena,
>>>>
>>>> I am a Gwyddion and AFM user, I will try to answer as far as I know:
>>>>
>>>>
>>>>
>>>>
>>>>>
>>>>>1.       I read: to calculate the rougness and waviness data I need
>>>>>to filter the AFM-Data first. So my question: In gwyddion when I use
>>>>>the roughness parameters application, do I first have to filter the
>>>>>data, or does gwyddion filter the data automatically in this application?
>>>>
>>>> I think you should first filter (whatever: plane fit, flatten, etc)
>>>> the image and then calculate the roughness data (for instance if you
>>>> do not correct the plane, the image may have very different
>>>> roughness
>>>> values)
>>>>
>>>>
>>>>
>>>>>2.       Does it make sense, to calculate the roughness in smaller
>>>>>areas of the sample, and the waviness in a greater areas? Because of
>>>>>the different structural size which matters. I thought about that,
>>>>>because I realized that when I change the thickness of the Scan line
>>>>>the roughness value drops with expanded lines, the waviness as well.
>>>>>So how should I use the application of the roughness parameters to
>>>>>describe my topographies best?
>>>>
>>>>  From my point of view, the roughness does depend on the area
>>>> sampled compared to the typical wavelength (or lateral extension) of
>>>> the surface features. If you have a characteristic surface feature
>>>> with an average size of  L, once your scan size is larger (2 or 3
>>>> times, for
>>>> instance) than L your roughness should more or less saturate (there
>>>> are papers on this issue).
>>>> Perhaps the roughness could drop as you see because your scan size
>>>> is so large that you do not have enough resolution to image properly
>>>> each characteristic surface feature. Regarding waviness I do not
>>>> work with this parameter, so I cannot tell you.
>>>>
>>>>
>>>>
>>>>
>>>>>3.       I have a glass substrate covered. But the coating doesn´t
>>>>>cover the glass everywhere.
>>>>>Has gwyddion any way to calculate the coverage factor?
>>>>
>>>> I think Philipp has answered this question already.
>>>>
>>>> regards,
>>>>
>>>> Luis
>>>>
>>>>
>>>>>
>>>>>Thanks Lena
>>>>>
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>>>
>>> --
>>> Palma D'Antonio
>>> Laboratorio di Fisica Applicata
>>> Dipartimento di scienze biomediche- Facoltà di Medicina e Chirurgia
>>> Università degli studi di Foggia
>>> email: p.danto...@unifg.it
>>> tel. 0881 732086
>>>
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>>
>>
>> --
>> Palma D'Antonio
>> Laboratorio di Fisica Applicata
>> Dipartimento di scienze biomediche- Facoltà di Medicina e Chirurgia
>> Università degli studi di Foggia
>> email: p.danto...@unifg.it
>> tel. 0881 732086
>>
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>
> --
> Palma D'Antonio
> Laboratorio di Fisica Applicata
> Dipartimento di scienze biomediche- Facoltà di Medicina e Chirurgia 
> Università degli studi di Foggia
> email: p.danto...@unifg.it
> tel. 0881 732086
>
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-- 
Palma D'Antonio
Laboratorio di Fisica Applicata
Dipartimento di scienze biomediche- Facoltà di Medicina e Chirurgia
Università degli studi di Foggia
email: p.danto...@unifg.it
tel. 0881 732086

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