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Yes, the figures are impressive! I wonder what kind of Bayesian insight one
should have to see that "in Fig. 6. The difference curve demonstrates that
Bayesian inference method better reproduces the observed diffraction profiles"
??
It seems that the open-access article charge serves as an
Dear All,
The deadline for the registration for the Debye-Rietveld meeting has been
extended to September 7th!
This year it is 100 years ago that Peter Debye introduced powder diffraction
and it is also 50 years ago that Hugo Rietveld introduced the profile method to
refine crystal structures
Probably of interest to several readers here, a new paper on
methodology:
"Use of Bayesian Inference in Crystallographic Structure Refinement via
Full Diffraction Profile Analysis"
Chris M. Fancher, Zhen Han, Igor Levin, Katharine Page, Brian J. Reich,
Ralph C. Smith, Alyson G. Wilson & Jacob
http://www.nature.com/articles/srep31625 on "Full Diffraction Profile
Analysis"
I like figure 1 and look forward to seeing the method applied to quantify
uncertainty by appropriately
modeling the heteroskedasticity and correlation of the error structure in
something other than silicon.
Alan