The NIST Metric Program, in cooperation with USMA member Mark Henschel, will bring its educational display to the 2001 TechEd Chicago program September 24--26, 2001 http://www.techedevents.org/chicago/index.asp This is the second year that the Metric Program has brought its metric educational materials to this technology oriented program, created by the Community College Foundation. With over 1500 expected attendees, this event offers an excellent opportunity to advance the importance of the metric system in America's education programs, particularly those involving technologies that may already rely on the metric system for their underlying concepts and processes. We encourage subscribers to this Listserv, educators and non-educators alike, to spread the word on this event. In the coming fiscal year the Metric Program will be attending fewer conferences with its educational displays as we focus on metric use on the labeling of American consumer products. However, as educational displays are scheduled we will continue to alert the USMA Listserv membership.
