THE WHATIS.COM WORD-OF-THE-DAY   
April 2, 2002

tin whisker 
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TODAY'S WORD: tin whisker 

See our definition with hyperlinks at
http://whatis.techtarget.com/definition/0,,sid9_gci813318,00.html 

A tin whisker is a single crystal of tin that grows spontaneously
from a tinned surface, a phenomenon that poses problems for
manufacturers who would prefer using tin rather than lead for
interconnections. As electronics manufacturers seek to make
electronic interconnections lead-free, many are looking at pure tin
soldering and coating as an economical alternative to traditional
tin-lead alloys. This, in turn, has resulted in a renewed interest in
the phenomenon of tin whiskers, which was first reported in the 1940s
and is generally believed to occur as a result of stress. 

Tin whiskers are typically only a few millimeters (mm) long, but some
grow to lengths of more than 10 mm. Tin whiskers can cause two
serious problems in electronic assemblies: they can cause electrical
shorts and they can break loose from their substrate and cause
mechanical damage. A lack of industry understanding about tin whisker
growth factors and a lack of testing methodology to identify
whisker-prone products has made pure tin interconnections and plating
risky for high reliability systems, such as satellites. However, it
is generally thought that the market demand for environmentally
friendly components will eventually outweigh the potential for tin
whisker component failure. Other metals that may grow whiskers
include zinc, cadmium, indium, and antimony. 

RELATED TERMS:

satellite
http://searchnetworking.techtarget.com/sDefinition/0,,sid7_gci212939,00.html 
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SELECTED LINKS:

The IPC encourages and supports research and development of lead-free
materials and technologies. 
http://www.leadfree.org/ 

Members of the Capacitor and Resistor Technology Symposium examined
the potential role of tin whiskers in component failure. 
http://www.e-insite.net/electronicnews/index.asp?layout=article&articleid=CA202968&industryid=2275
 

NASA reports that at least three orbiting commercial satellites have
failed because of tin whisker problems. 
http://nepp.nasa.gov/whisker/ 

The Tin Whisker Test Method Standardization Project, organized by the
National Electronics Manufacturing Initiative, is addressing the
problem of tin whiskers in lead-free assemblies.
http://www.siliconstrategies.com/story/OEG20020129S0003 
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