Remove memtest command.
Signed-off-by: Alexander Aring <[email protected]>
---
commands/Kconfig | 9 --
commands/Makefile | 1 -
commands/memtest.c | 351 -----------------------------------------------------
3 files changed, 361 deletions(-)
delete mode 100644 commands/memtest.c
diff --git a/commands/Kconfig b/commands/Kconfig
index 6a759ce..add547f 100644
--- a/commands/Kconfig
+++ b/commands/Kconfig
@@ -561,15 +561,6 @@ config CMD_NANDTEST
select PARTITION_NEED_MTD
prompt "nandtest"
-config CMD_MTEST
- tristate
- prompt "mtest"
-
-config CMD_MTEST_ALTERNATIVE
- bool
- depends on CMD_MTEST
- prompt "alternative mtest implementation"
-
endmenu
menu "video command"
diff --git a/commands/Makefile b/commands/Makefile
index 953ecc2..9d34a56 100644
--- a/commands/Makefile
+++ b/commands/Makefile
@@ -13,7 +13,6 @@ obj-$(CONFIG_CMD_MW) += mw.o
obj-$(CONFIG_CMD_MEMCMP) += memcmp.o
obj-$(CONFIG_CMD_MEMCPY) += memcpy.o
obj-$(CONFIG_CMD_MEMSET) += memset.o
-obj-$(CONFIG_CMD_MTEST) += memtest.o
obj-$(CONFIG_CMD_EDIT) += edit.o
obj-$(CONFIG_CMD_EXEC) += exec.o
obj-$(CONFIG_CMD_SLEEP) += sleep.o
diff --git a/commands/memtest.c b/commands/memtest.c
deleted file mode 100644
index 2d64d00..0000000
--- a/commands/memtest.c
+++ /dev/null
@@ -1,351 +0,0 @@
-/*
- * mtest - Perform a memory test
- *
- * (C) Copyright 2000
- * Wolfgang Denk, DENX Software Engineering, [email protected].
- *
- * See file CREDITS for list of people who contributed to this
- * project.
- *
- * This program is free software; you can redistribute it and/or
- * modify it under the terms of the GNU General Public License as
- * published by the Free Software Foundation; either version 2 of
- * the License, or (at your option) any later version.
- *
- * This program is distributed in the hope that it will be useful,
- * but WITHOUT ANY WARRANTY; without even the implied warranty of
- * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
- * GNU General Public License for more details.
- *
- */
-
-#include <common.h>
-#include <command.h>
-#include <types.h>
-
-/*
- * Perform a memory test. A more complete alternative test can be
- * configured using CONFIG_CMD_MTEST_ALTERNATIVE. The complete test
- * loops until interrupted by ctrl-c or by a failure of one of the
- * sub-tests.
- */
-#ifdef CONFIG_CMD_MTEST_ALTERNATIVE
-static int mem_test(ulong _start, ulong _end, ulong pattern_unused)
-{
- vu_long *start = (vu_long *)_start;
- vu_long *end = (vu_long *)_end;
- vu_long *addr;
- ulong val;
- ulong readback;
- vu_long addr_mask;
- vu_long offset;
- vu_long test_offset;
- vu_long pattern;
- vu_long temp;
- vu_long anti_pattern;
- vu_long num_words;
-#ifdef CFG_MEMTEST_SCRATCH
- vu_long *dummy = (vu_long*)CFG_MEMTEST_SCRATCH;
-#else
- vu_long *dummy = start;
-#endif
- int j;
- int iterations = 1;
-
- static const ulong bitpattern[] = {
- 0x00000001, /* single bit */
- 0x00000003, /* two adjacent bits */
- 0x00000007, /* three adjacent bits */
- 0x0000000F, /* four adjacent bits */
- 0x00000005, /* two non-adjacent bits */
- 0x00000015, /* three non-adjacent bits */
- 0x00000055, /* four non-adjacent bits */
- 0xaaaaaaaa, /* alternating 1/0 */
- };
-
- /* XXX: enforce alignment of start and end? */
- for (;;) {
- if (ctrlc()) {
- putchar ('\n');
- return 1;
- }
-
- printf("Iteration: %6d\r", iterations);
- iterations++;
-
- /*
- * Data line test: write a pattern to the first
- * location, write the 1's complement to a 'parking'
- * address (changes the state of the data bus so a
- * floating bus doen't give a false OK), and then
- * read the value back. Note that we read it back
- * into a variable because the next time we read it,
- * it might be right (been there, tough to explain to
- * the quality guys why it prints a failure when the
- * "is" and "should be" are obviously the same in the
- * error message).
- *
- * Rather than exhaustively testing, we test some
- * patterns by shifting '1' bits through a field of
- * '0's and '0' bits through a field of '1's (i.e.
- * pattern and ~pattern).
- */
- addr = start;
- /* XXX */
- if (addr == dummy) ++addr;
- for (j = 0; j < sizeof(bitpattern)/sizeof(bitpattern[0]); j++) {
- val = bitpattern[j];
- for(; val != 0; val <<= 1) {
- *addr = val;
- *dummy = ~val; /* clear the test data off of the bus */
- readback = *addr;
- if(readback != val) {
- printf ("FAILURE (data line): "
- "expected 0x%08lx, actual 0x%08lx at address
0x%p\n",
- val, readback, addr);
- }
- *addr = ~val;
- *dummy = val;
- readback = *addr;
- if(readback != ~val) {
- printf ("FAILURE (data line): "
- "Is 0x%08lx, should be 0x%08lx at address
0x%p\n",
- readback, ~val, addr);
- }
- }
- }
-
- /*
- * Based on code whose Original Author and Copyright
- * information follows: Copyright (c) 1998 by Michael
- * Barr. This software is placed into the public
- * domain and may be used for any purpose. However,
- * this notice must not be changed or removed and no
- * warranty is either expressed or implied by its
- * publication or distribution.
- */
-
- /*
- * Address line test
- *
- * Description: Test the address bus wiring in a
- * memory region by performing a walking
- * 1's test on the relevant bits of the
- * address and checking for aliasing.
- * This test will find single-bit
- * address failures such as stuck -high,
- * stuck-low, and shorted pins. The base
- * address and size of the region are
- * selected by the caller.
- *
- * Notes: For best results, the selected base
- * address should have enough LSB 0's to
- * guarantee single address bit changes.
- * For example, to test a 64-Kbyte
- * region, select a base address on a
- * 64-Kbyte boundary. Also, select the
- * region size as a power-of-two if at
- * all possible.
- *
- * Returns: 0 if the test succeeds, 1 if the test fails.
- *
- * ## NOTE ## Be sure to specify start and end
- * addresses such that addr_mask has
- * lots of bits set. For example an
- * address range of 01000000 02000000 is
- * bad while a range of 01000000
- * 01ffffff is perfect.
- */
- addr_mask = ((ulong)end - (ulong)start)/sizeof(vu_long);
- pattern = (vu_long) 0xaaaaaaaa;
- anti_pattern = (vu_long) 0x55555555;
-
- debug("%s:%d: addr mask = 0x%.8lx\n",
- __FUNCTION__, __LINE__,
- addr_mask);
- /*
- * Write the default pattern at each of the
- * power-of-two offsets.
- */
- for (offset = 1; (offset & addr_mask) != 0; offset <<= 1)
- start[offset] = pattern;
-
- /*
- * Check for address bits stuck high.
- */
- test_offset = 0;
- start[test_offset] = anti_pattern;
-
- for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
- temp = start[offset];
- if (temp != pattern) {
- printf ("\nFAILURE: Address bit stuck high @ 0x%.8lx:"
- " expected 0x%.8lx, actual 0x%.8lx\n",
- (ulong)&start[offset], pattern, temp);
- return 1;
- }
- }
- start[test_offset] = pattern;
-
- /*
- * Check for addr bits stuck low or shorted.
- */
- for (test_offset = 1; (test_offset & addr_mask) != 0;
test_offset <<= 1) {
- start[test_offset] = anti_pattern;
-
- for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
- temp = start[offset];
- if ((temp != pattern) && (offset != test_offset)) {
- printf ("\nFAILURE: Address bit stuck low or
shorted @"
- " 0x%.8lx: expected 0x%.8lx, actual 0x%.8lx\n",
- (ulong)&start[offset], pattern, temp);
- return 1;
- }
- }
- start[test_offset] = pattern;
- }
-
- /*
- * Description: Test the integrity of a physical
- * memory device by performing an
- * increment/decrement test over the
- * entire region. In the process every
- * storage bit in the device is tested
- * as a zero and a one. The base address
- * and the size of the region are
- * selected by the caller.
- *
- * Returns: 0 if the test succeeds, 1 if the test fails.
- */
- num_words = ((ulong)end - (ulong)start)/sizeof(vu_long) + 1;
-
- /*
- * Fill memory with a known pattern.
- */
- for (pattern = 1, offset = 0; offset < num_words; pattern++,
offset++) {
- start[offset] = pattern;
- }
-
- /*
- * Check each location and invert it for the second pass.
- */
- for (pattern = 1, offset = 0; offset < num_words; pattern++,
offset++) {
- temp = start[offset];
- if (temp != pattern) {
- printf ("\nFAILURE (read/write) @ 0x%.8lx:"
- " expected 0x%.8lx, actual 0x%.8lx)\n",
- (ulong)&start[offset], pattern, temp);
- return 1;
- }
-
- anti_pattern = ~pattern;
- start[offset] = anti_pattern;
- }
-
- /*
- * Check each location for the inverted pattern and zero it.
- */
- for (pattern = 1, offset = 0; offset < num_words; pattern++,
offset++) {
- anti_pattern = ~pattern;
- temp = start[offset];
- if (temp != anti_pattern) {
- printf ("\nFAILURE (read/write): @ 0x%.8lx:"
- " expected 0x%.8lx, actual 0x%.8lx)\n",
- (ulong)&start[offset], anti_pattern, temp);
- return 1;
- }
- start[offset] = 0;
- }
- }
-
-}
-#else
-static int mem_test(ulong _start, ulong _end, ulong pattern)
-{
- vu_long *addr;
- vu_long *start = (vu_long *)_start;
- vu_long *end = (vu_long *)_end;
- ulong val;
- ulong readback;
- ulong incr;
- int rcode;
-
- incr = 1;
- for (;;) {
- if (ctrlc()) {
- putchar('\n');
- return 1;
- }
-
- printf ("\rPattern 0x%08lX Writing..."
- "%12s"
- "\b\b\b\b\b\b\b\b\b\b",
- pattern, "");
-
- for (addr=start,val=pattern; addr<end; addr++) {
- *addr = val;
- val += incr;
- }
-
- puts ("Reading...");
-
- for (addr=start,val=pattern; addr<end; addr++) {
- readback = *addr;
- if (readback != val) {
- printf ("\nMem error @ 0x%08X: "
- "found 0x%08lX, expected 0x%08lX\n",
- (uint)addr, readback, val);
- rcode = 1;
- }
- val += incr;
- }
-
- /*
- * Flip the pattern each time to make lots of zeros and
- * then, the next time, lots of ones. We decrement
- * the "negative" patterns and increment the "positive"
- * patterns to preserve this feature.
- */
- if(pattern & 0x80000000) {
- pattern = -pattern; /* complement & increment */
- }
- else {
- pattern = ~pattern;
- }
- incr = -incr;
- }
- return rcode;
-}
-#endif
-
-static int do_mem_mtest(int argc, char *argv[])
-{
- ulong start, end, pattern = 0;
-
- if (argc < 3)
- return COMMAND_ERROR_USAGE;
-
- start = simple_strtoul(argv[1], NULL, 0);
- end = simple_strtoul(argv[2], NULL, 0);
-
- if (argc > 3)
- pattern = simple_strtoul(argv[3], NULL, 0);
-
- printf ("Testing 0x%08x ... 0x%08x:\n", (uint)start, (uint)end);
-
- return mem_test(start, end, pattern);
-}
-
-static const __maybe_unused char cmd_mtest_help[] =
-"Usage: <start> <end> "
-#ifdef CONFIG_CMD_MTEST_ALTERNATIVE
-"[pattern]"
-#endif
-"\nsimple RAM read/write test\n";
-
-BAREBOX_CMD_START(mtest)
- .cmd = do_mem_mtest,
- .usage = "simple RAM test",
- BAREBOX_CMD_HELP(cmd_mtest_help)
-BAREBOX_CMD_END
-
--
1.8.3
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