https://sourceware.org/bugzilla/show_bug.cgi?id=23854
Bug ID: 23854
Summary: -no-pie -export-dynamic corrupts binary
Product: binutils
Version: 2.30
Status: UNCONFIRMED
Severity: critical
Priority: P2
Component: ld
Assignee: unassigned at sourceware dot org
Reporter: stsp at users dot sourceforge.net
Target Milestone: ---
Created attachment 11375
--> https://sourceware.org/bugzilla/attachment.cgi?id=11375&action=edit
test case
Out of sudden my prog started to randomly crash on i386 target.
It appears the combination of options -no-pie -export-dynamic
causes ld to randomly corrupt the code section.
Attached is the fully automated test-case.
Just type "make" - it will link the executable and look
with gdb at the assembler in one particular place where
I spotted the corruption. It will then print "TEST FAILED!".
You can run "make good" that will do the same but without
-export-dynamic. This will end up in "TEST PASSED!".
gold has no such problem.
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