*** For details on how to be removed from this list visit the ***
*** CCP4 home page http://www.ccp4.ac.uk ***
If it does not need to be a specific crystal, I would choose one with a
high symmetry and a reasonably large cell so that you get a high number of
symmetry related reflections per image.
From that crystal I would collect enough data to reliably refine Detector
distance, cell, and so on, e.g. one data set.
Once all parameters are refined I would collect a small wedge over and
over again and process them with all parameters fixed to the above values
(eventually let the cell be refined since that may change).
Finally I would look at the intensity distribution of the integrated data
with gnuplot or octave or alike.
Or you could scale all wedges to the reference data set and try to
interprete the scale factors applied.
Is that too naive an approach?
--
Tim Gruene
Institut fuer anorganische Chemie
Tammannstr. 4
D-37077 Goettingen
GPG Key ID = A46BEE1A
On Tue, 7 Nov 2006, JXQI wrote:
This is not a question directly related to ccp4 as far as I can tell, but I'm
hoping someone on this list may have some insight.
We are now trying a new crystal mounting method, I want to know weather there
is any decay of intensities in the process of data collection.I use the R-AXIS
IV++ imaging-plate detector and the CrystalClear to process the data. If any
person has a reference, I would be grateful.
Thank you in advance for your help!
Janxon
