Back in the early 1980’s when using a single counter diffractometer, we would collect the same 500 reflections at the end of data collection that we collected at the beginning.  The scale factor between the two “batches” of reflections would be a direct measure of the decay of intensity if the source intensity remained constant.

 

This is essentially what Tim wrote.

 

So just collect the exact same rotation scan of images at the beginning and end of data collection.  CrystalClear will compute the scale factors for you and jdtplot will plot them for you.

 

Jim

 


From: [EMAIL PROTECTED] [mailto:[EMAIL PROTECTED] On Behalf Of JXQI
Sent: Tuesday, November 07, 2006 9:03 AM
To: [email protected]
Subject: [ccp4bb]: How to determine the decay of intensity of a crystal during data collecting?

 

This is not a question directly related to ccp4 as far as I can tell, but I'm hoping someone on this list may have some insight.

 

We are now trying a new crystal mounting method, I want to know weather there is any decay of intensities in the process of data collection.I use the R-AXIS IV++ imaging-plate detector and the CrystalClear to process  the data. If any person has a reference, I would be grateful.

 

Thank you in advance for your help!

 

Janxon

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