This should probably be reviewed by the nio-dev folk.
Increasing the timeouts seems okay but how confident are you that this
is sufficient for a wide range of platforms. In other tests we often see
timeouts of a few seconds get extended even further, so three seconds is
not so big.
Also the yield loops:
while (sleeper.entries < 5)
Thread.yield();
would be better as sleep loops (as used elsewhere) to avoid potential
issues with yield being a no-op on some platforms (Yes I see it is
already used that way elsewhere in the test but the sleep is better :) ).
Thanks,
David
On 3/12/2013 12:39 PM, srikalyan chandrashekar wrote:
Hi all, I am working on bug JDK-6963118
<https://bugs.openjdk.java.net/browse/JDK-6963118> .
Root Cause:
- Sensitive timing dependency between events in Main and Sleeper threads
are causes for test failure.
Suggested Fix:
1) Main thread should wait for more than 1sec(made it 3sec) and check
more often than 50ms(made it 1ms) intervals , sleeper thread may be
still waiting for interrupt/wakeup hence main thread waiting for just
1sec to flag a failure is premature . The reason is especially on
windows high priority virus scanners etc run(we faced it when simulating
failures) and kept the system busy.
2) The test is essentially a sequence of 2 events
a)Firing up wakeups/interrupts followed by a
b)Check
Check the sleeper.entries value and yield the main thread as required
so that the above 2 events step in tandem.
The webrev is hosted at
http://cr.openjdk.java.net/~cl/host_for_kal/6963118-Wakeup/ .
Please let me know if you have any comments or suggestions.
