On Fri, 16 Oct 2026 17:30:52 GMT, Bill Huang <[email protected]> wrote:
> This follows JDK-8394676 (#33391), which removed the duplicated VClass test > code from the java/util/Collections tests. It replaces #32201 and keeps value > class coverage only where the java.util code under test behaves differently > for value objects. > > HashMap/PutNullKey.java > When colliding keys in a HashMap tree bin are not Comparable, > HashMap.TreeNode.tieBreakOrder orders them by System.identityHashCode. For a > value object, the identity hash code is derived from the object's field > values, so the tree takes a different shape than with identity objects. No > existing test reaches this path, even with identity keys: every colliding-key > test uses Comparable keys. > > Collections/Ser.java > Refactoring only, with no change in behavior or coverage. Ser already covers > serializing Collections.singleton and nCopies with a value class element > through a writeReplace/readResolve proxy. This change only consolidates its > six identical serialize/deserialize/compare blocks into one helper method. > > --------- > - [x] I confirm that I make this contribution in accordance with the [OpenJDK > Interim AI Policy](https://openjdk.org/legal/ai). This pull request has now been integrated. Changeset: 6ed82b3b Author: Bill Huang <[email protected]> URL: https://git.openjdk.org/jdk/commit/6ed82b3b15804a9e6b1d93513936db0d10e40a7e Stats: 137 lines in 3 files changed: 45 ins; 74 del; 18 mod 8384611: Improve value class test coverage in java/util Collections/Ser and HashMap/PutNullKey Reviewed-by: smarks ------------- PR: https://git.openjdk.org/jdk/pull/33418
