Merci Pascal pour la commande que je ne connaissais pas...
Cela finit de me convaincre que le disque (magnétique) est en très
mauvaise forme...
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
smartctl -a /dev/sdb
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-41-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Hitachi HTS543232A7A384
Serial Number: E2P3121L09BVPP
LU WWN Device Id: 5 000cca 706c443dd
Firmware Version: ES2OA60W
User Capacity: 320 072 933 376 bytes [320 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Wed Dec 10 11:41:45 2014 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 88) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 001 001 062 Pre-fail Always
FAILING_NOW 4294963998
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline
- 0
3 Spin_Up_Time 0x0007 253 253 033 Pre-fail Always
- 1
4 Start_Stop_Count 0x0012 099 099 000 Old_age Always
- 2811
5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always
FAILING_NOW 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always
- 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline
- 0
9 Power_On_Hours 0x0012 095 095 000 Old_age Always
- 2419
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always
- 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always
- 2787
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always
- 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always
- 49
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always
- 3618
194 Temperature_Celsius 0x0002 250 250 000 Old_age Always
- 24 (Min/Max 8/46)
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always
- 2626
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always
- 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always
- 0
SMART Error Log Version: 1
ATA Error Count: 65535 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 65535 occurred at disk power-on lifetime: 2418 hours (100 days + 18 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 06 0a 00 00 00 Error: UNC 6 sectors at LBA = 0x0000000a = 10
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d0 08 08 00 00 40 00 02:06:30.340 READ DMA EXT
25 d0 08 00 00 00 40 00 02:06:29.595 READ DMA EXT
35 d0 08 00 00 00 40 00 02:05:21.906 WRITE DMA EXT
25 d0 08 08 00 00 40 00 02:05:18.083 READ DMA EXT
25 d0 08 00 00 00 40 00 02:05:17.183 READ DMA EXT
Error 65534 occurred at disk power-on lifetime: 2418 hours (100 days + 18 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 06 0a 00 00 00 Error: UNC 6 sectors at LBA = 0x0000000a = 10
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d0 08 08 00 00 40 00 02:05:18.083 READ DMA EXT
25 d0 08 00 00 00 40 00 02:05:17.183 READ DMA EXT
25 d0 08 00 00 00 40 00 02:04:10.392 READ DMA EXT
25 d0 08 08 00 00 40 00 02:04:09.163 READ DMA EXT
b0 d0 40 20 4f c2 00 00 02:04:09.159 SMART READ DATA
Error 65533 occurred at disk power-on lifetime: 2418 hours (100 days + 18 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 16 0a 00 00 00 Error: UNC 22 sectors at LBA = 0x0000000a = 10
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d0 20 00 00 00 40 00 02:03:56.260 READ DMA EXT
25 d0 01 a8 ea 42 40 00 02:03:52.771 READ DMA EXT
25 d0 01 a8 ea 42 40 00 02:03:49.269 READ DMA EXT
25 d0 20 00 00 00 40 00 02:03:43.858 READ DMA EXT
25 d0 08 00 00 00 40 00 02:03:41.319 READ DMA EXT
Error 65532 occurred at disk power-on lifetime: 2418 hours (100 days + 18 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 a8 ea 42 05 Error: UNC 1 sectors at LBA = 0x0542eaa8 = 88271528
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d0 01 a8 ea 42 40 00 02:03:52.771 READ DMA EXT
25 d0 01 a8 ea 42 40 00 02:03:49.269 READ DMA EXT
25 d0 20 00 00 00 40 00 02:03:43.858 READ DMA EXT
25 d0 08 00 00 00 40 00 02:03:41.319 READ DMA EXT
b0 d0 08 00 4f c2 00 00 02:00:03.282 SMART READ DATA
Error 65531 occurred at disk power-on lifetime: 2418 hours (100 days + 18 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 a8 ea 42 05 Error: UNC 1 sectors at LBA = 0x0542eaa8 = 88271528
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d0 01 a8 ea 42 40 00 02:03:49.269 READ DMA EXT
25 d0 20 00 00 00 40 00 02:03:43.858 READ DMA EXT
25 d0 08 00 00 00 40 00 02:03:41.319 READ DMA EXT
b0 d0 08 00 4f c2 00 00 02:00:03.282 SMART READ DATA
e0 d0 08 00 4f c2 00 00 01:58:36.278 STANDBY IMMEDIATE
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Le 10/12/2014 11:01, Pascal Hambourg a écrit :
> smartctl -a /dev/
--
Pro. Signature
Pierre Touzeau
----------------------------------------------------------
Chargé de mission / Préfecture de region Basse-Normandie
SGAR/rue Daniel HUET/14038 CAEN CEDEX/Tel: +33 231 306 306
[email protected] / Fax: ... 564
----------------------------------------------------------
