bonjour,
personellement j'ai jamais pu aller plus loin quand smartmontools me donne
un result: FAILED au lieu de PASSED:

SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.

a ta place je changerai de disque direct !
Le 10 déc. 2014 11:48, "Pierre TOUZEAU" <
[email protected]> a écrit :

>  Merci Pascal pour la commande que je ne connaissais pas...
> Cela finit de me convaincre que le disque (magnétique) est en très
> mauvaise forme...
>
> SMART overall-health self-assessment test result: FAILED!
> Drive failure expected in less than 24 hours. SAVE ALL DATA.
>
>
>
>
> smartctl -a /dev/sdb
>
> smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-41-generic] (local build)
> Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
>
> === START OF INFORMATION SECTION ===
> Device Model:     Hitachi HTS543232A7A384
> Serial Number:    E2P3121L09BVPP
> LU WWN Device Id: 5 000cca 706c443dd
> Firmware Version: ES2OA60W
> User Capacity:    320 072 933 376 bytes [320 GB]
> Sector Size:      512 bytes logical/physical
> Rotation Rate:    5400 rpm
> Device is:        Not in smartctl database [for details use: -P showall]
> ATA Version is:   ATA8-ACS T13/1699-D revision 6
> SATA Version is:  SATA 2.6, 3.0 Gb/s
> Local Time is:    Wed Dec 10 11:41:45 2014 CET
> SMART support is: Available - device has SMART capability.
> SMART support is: Enabled
>
> === START OF READ SMART DATA SECTION ===
> SMART overall-health self-assessment test result: FAILED!
> Drive failure expected in less than 24 hours. SAVE ALL DATA.
> See vendor-specific Attribute list for failed Attributes.
>
> General SMART Values:
> Offline data collection status:  (0x00)       Offline data collection activity
>                                       was never started.
>                                       Auto Offline Data Collection: Disabled.
> Self-test execution status:      (   0)       The previous self-test routine 
> completed
>                                       without error or no self-test has ever
>                                       been run.
> Total time to complete Offline
> data collection:              (   45) seconds.
> Offline data collection
> capabilities:                          (0x5b) SMART execute Offline immediate.
>                                       Auto Offline data collection on/off 
> support.
>                                       Suspend Offline collection upon new
>                                       command.
>                                       Offline surface scan supported.
>                                       Self-test supported.
>                                       No Conveyance Self-test supported.
>                                       Selective Self-test supported.
> SMART capabilities:            (0x0003)       Saves SMART data before entering
>                                       power-saving mode.
>                                       Supports SMART auto save timer.
> Error logging capability:        (0x01)       Error logging supported.
>                                       General Purpose Logging supported.
> Short self-test routine
> recommended polling time:      (   2) minutes.
> Extended self-test routine
> recommended polling time:      (  88) minutes.
> SCT capabilities:            (0x003d) SCT Status supported.
>                                       SCT Error Recovery Control supported.
>                                       SCT Feature Control supported.
>                                       SCT Data Table supported.
>
> SMART Attributes Data Structure revision number: 16
> Vendor Specific SMART Attributes with Thresholds:
> ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  
> WHEN_FAILED RAW_VALUE
>   1 Raw_Read_Error_Rate     0x000b   001   001   062    Pre-fail  Always   
> FAILING_NOW 4294963998
>   2 Throughput_Performance  0x0005   100   100   040    Pre-fail  Offline     
>  -       0
>   3 Spin_Up_Time            0x0007   253   253   033    Pre-fail  Always      
>  -       1
>   4 Start_Stop_Count        0x0012   099   099   000    Old_age   Always      
>  -       2811
>   5 Reallocated_Sector_Ct   0x0033   001   001   005    Pre-fail  Always   
> FAILING_NOW 0
>   7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always      
>  -       0
>   8 Seek_Time_Performance   0x0005   100   100   040    Pre-fail  Offline     
>  -       0
>   9 Power_On_Hours          0x0012   095   095   000    Old_age   Always      
>  -       2419
>  10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always      
>  -       0
>  12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always      
>  -       2787
> 191 G-Sense_Error_Rate      0x000a   100   100   000    Old_age   Always      
>  -       0
> 192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always      
>  -       49
> 193 Load_Cycle_Count        0x0012   100   100   000    Old_age   Always      
>  -       3618
> 194 Temperature_Celsius     0x0002   250   250   000    Old_age   Always      
>  -       24 (Min/Max 8/46)
> 196 Reallocated_Event_Count 0x0032   001   001   000    Old_age   Always      
>  -       2626
> 197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always      
>  -       0
> 198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline     
>  -       0
> 199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always      
>  -       0
> 223 Load_Retry_Count        0x000a   100   100   000    Old_age   Always      
>  -       0
>
> SMART Error Log Version: 1
> ATA Error Count: 65535 (device log contains only the most recent five errors)
>       CR = Command Register [HEX]
>       FR = Features Register [HEX]
>       SC = Sector Count Register [HEX]
>       SN = Sector Number Register [HEX]
>       CL = Cylinder Low Register [HEX]
>       CH = Cylinder High Register [HEX]
>       DH = Device/Head Register [HEX]
>       DC = Device Command Register [HEX]
>       ER = Error register [HEX]
>       ST = Status register [HEX]
> Powered_Up_Time is measured from power on, and printed as
> DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
> SS=sec, and sss=millisec. It "wraps" after 49.710 days.
>
> Error 65535 occurred at disk power-on lifetime: 2418 hours (100 days + 18 
> hours)
>   When the command that caused the error occurred, the device was active or 
> idle.
>
>   After command completion occurred, registers were:
>   ER ST SC SN CL CH DH
>   -- -- -- -- -- -- --
>   40 51 06 0a 00 00 00  Error: UNC 6 sectors at LBA = 0x0000000a = 10
>
>   Commands leading to the command that caused the error were:
>   CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
>   -- -- -- -- -- -- -- --  ----------------  --------------------
>   25 d0 08 08 00 00 40 00      02:06:30.340  READ DMA EXT
>   25 d0 08 00 00 00 40 00      02:06:29.595  READ DMA EXT
>   35 d0 08 00 00 00 40 00      02:05:21.906  WRITE DMA EXT
>   25 d0 08 08 00 00 40 00      02:05:18.083  READ DMA EXT
>   25 d0 08 00 00 00 40 00      02:05:17.183  READ DMA EXT
>
> Error 65534 occurred at disk power-on lifetime: 2418 hours (100 days + 18 
> hours)
>   When the command that caused the error occurred, the device was active or 
> idle.
>
>   After command completion occurred, registers were:
>   ER ST SC SN CL CH DH
>   -- -- -- -- -- -- --
>   40 51 06 0a 00 00 00  Error: UNC 6 sectors at LBA = 0x0000000a = 10
>
>   Commands leading to the command that caused the error were:
>   CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
>   -- -- -- -- -- -- -- --  ----------------  --------------------
>   25 d0 08 08 00 00 40 00      02:05:18.083  READ DMA EXT
>   25 d0 08 00 00 00 40 00      02:05:17.183  READ DMA EXT
>   25 d0 08 00 00 00 40 00      02:04:10.392  READ DMA EXT
>   25 d0 08 08 00 00 40 00      02:04:09.163  READ DMA EXT
>   b0 d0 40 20 4f c2 00 00      02:04:09.159  SMART READ DATA
>
> Error 65533 occurred at disk power-on lifetime: 2418 hours (100 days + 18 
> hours)
>   When the command that caused the error occurred, the device was active or 
> idle.
>
>   After command completion occurred, registers were:
>   ER ST SC SN CL CH DH
>   -- -- -- -- -- -- --
>   40 51 16 0a 00 00 00  Error: UNC 22 sectors at LBA = 0x0000000a = 10
>
>   Commands leading to the command that caused the error were:
>   CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
>   -- -- -- -- -- -- -- --  ----------------  --------------------
>   25 d0 20 00 00 00 40 00      02:03:56.260  READ DMA EXT
>   25 d0 01 a8 ea 42 40 00      02:03:52.771  READ DMA EXT
>   25 d0 01 a8 ea 42 40 00      02:03:49.269  READ DMA EXT
>   25 d0 20 00 00 00 40 00      02:03:43.858  READ DMA EXT
>   25 d0 08 00 00 00 40 00      02:03:41.319  READ DMA EXT
>
> Error 65532 occurred at disk power-on lifetime: 2418 hours (100 days + 18 
> hours)
>   When the command that caused the error occurred, the device was active or 
> idle.
>
>   After command completion occurred, registers were:
>   ER ST SC SN CL CH DH
>   -- -- -- -- -- -- --
>   40 51 01 a8 ea 42 05  Error: UNC 1 sectors at LBA = 0x0542eaa8 = 88271528
>
>   Commands leading to the command that caused the error were:
>   CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
>   -- -- -- -- -- -- -- --  ----------------  --------------------
>   25 d0 01 a8 ea 42 40 00      02:03:52.771  READ DMA EXT
>   25 d0 01 a8 ea 42 40 00      02:03:49.269  READ DMA EXT
>   25 d0 20 00 00 00 40 00      02:03:43.858  READ DMA EXT
>   25 d0 08 00 00 00 40 00      02:03:41.319  READ DMA EXT
>   b0 d0 08 00 4f c2 00 00      02:00:03.282  SMART READ DATA
>
> Error 65531 occurred at disk power-on lifetime: 2418 hours (100 days + 18 
> hours)
>   When the command that caused the error occurred, the device was active or 
> idle.
>
>   After command completion occurred, registers were:
>   ER ST SC SN CL CH DH
>   -- -- -- -- -- -- --
>   40 51 01 a8 ea 42 05  Error: UNC 1 sectors at LBA = 0x0542eaa8 = 88271528
>
>   Commands leading to the command that caused the error were:
>   CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
>   -- -- -- -- -- -- -- --  ----------------  --------------------
>   25 d0 01 a8 ea 42 40 00      02:03:49.269  READ DMA EXT
>   25 d0 20 00 00 00 40 00      02:03:43.858  READ DMA EXT
>   25 d0 08 00 00 00 40 00      02:03:41.319  READ DMA EXT
>   b0 d0 08 00 4f c2 00 00      02:00:03.282  SMART READ DATA
>   e0 d0 08 00 4f c2 00 00      01:58:36.278  STANDBY IMMEDIATE
>
> SMART Self-test log structure revision number 1
> No self-tests have been logged.  [To run self-tests, use: smartctl -t]
>
>
> SMART Selective self-test log data structure revision number 1
>  SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
>     1        0        0  Not_testing
>     2        0        0  Not_testing
>     3        0        0  Not_testing
>     4        0        0  Not_testing
>     5        0        0  Not_testing
> Selective self-test flags (0x0):
>   After scanning selected spans, do NOT read-scan remainder of disk.
> If Selective self-test is pending on power-up, resume after 0 minute delay.
>
>
>
>
>
> Le 10/12/2014 11:01, Pascal Hambourg a écrit :
>
> smartctl -a /dev/
>
>
> --
>
> Pierre Touzeau
>
> ----------------------------------------------------------
> Chargé de mission  /  Préfecture de region Basse-Normandie
> SGAR/rue Daniel HUET/14038 CAEN CEDEX/Tel: +33 231 306 306
> [email protected] / Fax: ... 564
> ----------------------------------------------------------
>

Répondre à