C A L L F O R P A P E R S 2003 Workshop on Statistical Analysis in Computer Vision (SACV)
http://www.cse.lehigh.edu/~rjm2/SACV June 21-22, 2003 Madison, Wisconsin, USA In conjunction with the 2003 IEEE Computer Vision and Pattern Recognition Conference Goals and Scope Statistical analysis has always played an important role across a wide range of computer vision topics. The complexity and ill-posed nature of many computer vision problems, however, often makes statistical analysis using traditional approaches difficult. The goal of this workshop is to stimulate research in all aspects of statistical analysis in computer vision. The workshop is aimed at bringing together researchers from computer vision, mathematics, statistics, information theory, and visual psychology to address key issues in statistical analysis in vision systems. Original papers are solicited on topics including, but not limited to: * the use of advanced statistical tools in modeling, design, and evaluation of algorithms, systems, and sensors * the propagation of errors models through vision modules * the analysis and justification of statistical assumptions used in vision algorithms * novel statistical methods applied to vision problems * unification, generalizations, and extensions of existing statistical models Research regarding the theoretical aspects of the above topics is especially encouraged. The expectation is for more detailed discussion of the "statistical" aspects than would occur in a normal CVPR paper. Organizing Committee Terrance E. Boult Lehigh University Peter Meer Rutgers University Ross J. Micheals NIST Visvanathan Ramesh Siemens Program Committee Horst Bischof Technische Universitat Graz Kevin W. Bowyer University of Notre Dame Henrik I. Christensen KTH, Royal Institute of Technology Dorin Comaniciu Siemens, SCR Hany Farid Dartmouth College Andrew Fitzgibbon University of Oxford Wolfgang Forstner Universitat Bonn Edwin Hancock University of York Qiang Ji Rensselaer Polytechnic Institute Kenichi Kanatani Okayama University Yann LeCun NEC Laboratories Ales Leonardis University of Ljubljana Stan Li Microsoft Bogdan Matei Sarnoff Corporation Peter Sturm INRIA Chuck Stewart Rensselaer Polytechnic Institute Zhengyou Zhang Microsoft Submission Instructions IMPORTANT: All authors who submit papers will also be automatically added to the pool of potential reviewers. Before you submit a paper, please understand that you will likely be asked to review two or three submissions. Papers are due by 1700 EST on Friday, February 14th, 2003. Electronic submission instructions can be found off of the workshop website. Papers should be no longer than eight pages (10 point font, two-columns), and otherwise conforming to the CVPR 2003 formatting requirements. Accompanying multimedia may be submitted along with your paper, and, pending approval, will be distributed along with your paper on the proceedings CD-ROM. Paper reviews will be performed double-blind. Accepted papers will be published by the IEEE in CD-ROM format and indexed in the IEEExplore website. More information about this workshop may be found on the workshop homepage. . . ================================================================= Instructions for joining and leaving this list, remarks about the problem of INAPPROPRIATE MESSAGES, and archives are available at: . http://jse.stat.ncsu.edu/ . =================================================================
