It is my understanding that the primary use of HALT is to sort out
infant mortality of electronic devices and to identify potential
solder/pc deficiencies.
-----Original Message-----
From: Jim Eichner [SMTP:jeich...@statpower.com]
Sent: Tuesday, January 20, 1998 12:09 PM
To: emc-p...@ieee.org
Subject: RE: HALT testing
Sounds like an interesting approach, but it sounds like it will
only
uncover those failure modes that are related to the product's
environment. What about line voltage fluctuations, surges,
etc., or for
power supplies things like load cycling, load transients, etc.
Does
anyone know if there are established HALT procedures that
include these
sorts of things? Thanks.
Regards,
Jim Eichner
Statpower Technologies Corporation
jeich...@statpower.com
http://www.statpower.com
The opinions expressed are those of my invisible friend, who
really
exists. Honest.
> -----Original Message-----
> From: MVA 850SS [SMTP:mva85...@aol.com]
> Sent: Monday, January 19, 1998 5:45 PM
> To: r...@itsqs.com; emc-p...@ieee.org
> Subject: Re: HALT testing
>
> HALT, Highly Accelerated Life Testing is a test-to-failure
approach to
> determine weak designs. You don't ever "pass" HALT, you just
reach a
> point of
> diminishing returns from a design cost/improvement ratio.
There are
> various
> parameters that change such as vibration, temperature and
humidity.
> All those
> change in a predetermined (or not) pseudo-random fashion. It
is an
> excellent
> approach to determine quickly what the likely warranty returns
will be
> or what
> the long term failures will be!
