Doug, What distribution did you use for the calculation. This may be a major assumption and the AF can vary by several times? Richard Haynes -----Original Message----- From: Douglas Mckean <[email protected]> To: '[email protected]' <[email protected]> List-Post: [email protected] Date: Wednesday, July 22, 1998 7:17 PM Subject: Re: Reliability Tests
>Not sure I have this right but why not just do some >accelerated temp testing with a sample quantity? > >I calculate that 16,006 hrs (95.27 weeks) at 20 degrees C >reduces to just 6.01 weeks at 65 degrees C. > >Regards, Doug > >Jon Ilseng wrote: >> >> For the reliability engineers out there, I am looking for ideas on how >> to perform a reliability test for a Base Transceiver Subsystem with a >> predicted MTBF of 16,006 hours. Researching the MIL-HDBK-781 test >> plans, the shortest test time is Test Plan XXID. Test Plan XXID has a >> test duration of 17,606.6 hours (1.1 X 16,006 hours). This is >> equivalent to 733 days or 2 years just to conduct a reliability test. >> Plus, Test Plan XXID allows no relevant failures. There has to be a >> smarter and more cost effective method to perform a reliability test to >> verify this 16,006-hour MTBF. Any ideas would be greatly appreciated. >
