Not sure I have this right but why not just do some accelerated temp testing with a sample quantity?
I calculate that 16,006 hrs (95.27 weeks) at 20 degrees C reduces to just 6.01 weeks at 65 degrees C. Regards, Doug Jon Ilseng wrote: > > For the reliability engineers out there, I am looking for ideas on how > to perform a reliability test for a Base Transceiver Subsystem with a > predicted MTBF of 16,006 hours. Researching the MIL-HDBK-781 test > plans, the shortest test time is Test Plan XXID. Test Plan XXID has a > test duration of 17,606.6 hours (1.1 X 16,006 hours). This is > equivalent to 733 days or 2 years just to conduct a reliability test. > Plus, Test Plan XXID allows no relevant failures. There has to be a > smarter and more cost effective method to perform a reliability test to > verify this 16,006-hour MTBF. Any ideas would be greatly appreciated.
