We use HALT here at Schweitzer Engineering Labs to help improve the reliability
of power protection relays (devices that among other things control circuit
breakers on power lines, using measured currents and voltages to detect faults).
We want to have MTBF times in hundreds of years, so that if the lights go out in
Los Angeles, it was caused by something besides our relays.

In my previous life at Hewlett-Packard/Agilent Technology, we used HALT,
sometimes HASS, and MTBF calculations to improve product reliability. One
engineer did a comparison of the failures of a certain product predicted using
MTBF calculations on components vs. actual field failures. The correlation was
suprisingly good. I can't exactly remember the sorting technique, but the
conclusion was that 85% of the component failures in the field were found at the
top of the components list sorted by MTBF.

My observation is that MTBF calculations help you design out the worst
offenders, and pay special attention to those potentially high failure rate
parts that cannot be designed out. HALT helps catch those things that fall
through the cracks, either because their life characteristics are not known,
someone made a mistake, or there are process problems (either at the
manufacturer or in your own plant) which cause higher than expected failure
rates.

The last cause if the most problematical. You can have a component that has a
low predicted failure rate, has been tested over and over, even in your own HALT
program, and later becomes a big problem when the manufacturer loses the recipe.

Don Borowski
Schweitzer Engineering Labs





"Brian O'Connell" <[email protected]> on 08/01/2002 06:53:59 AM

Please respond to "Brian O'Connell" <[email protected]>

To:   "[email protected]" <[email protected]>
cc:    (bcc: Don Borowski/SEL)
Subject:  RE: HALT and HAAS




Interesting observations from all. I would appreciate if the good people
that posted on this subject could reveal the item, or product category being
tested. It would be interesting to see the "relative relevance" of each test
or analysis technique (e.g., MH217, HALT, HASS, ESS, etc) to the product's
short and long-term performance.

In my current job, I apply HALT and MTBF calculations to component power
supplies. HALT seems to quickly reveal a physical or electronic design
weakness. But once (manager-selected) design flaws have been removed, HALT
does not seem to predict which component is likely to fail over the power
supply's life.

I have researched some of my employer's MTBF reports and found most to
accurately predict failure modes.

Brian

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