John, one of the problems with defining "criteria" is that you cannot
define criteria that will encompass all of the past, present, and future
equipment in the world. Only the manufacturer (keeping in mind his
customers and competitors) can definitively define what is or is not
acceptable.
Bob Heller
3M EMC Laboratory, 76-1-01
St. Paul, MN 55107-1208
Tel: 651- 778-6336
Fax: 651-778-6252
============================================================
"John Harrington"
<jharrington@keit
hley.com> To
Sent by: <[email protected]>
[email protected] cc
Subject
11/07/2008 07:21 FW: Deviation of Performance
AM Criteria
Hi Group
While we all have our copies of EN 61326 close at hand I’d like to see what
your consensus of opinion is on the meaning of paragraph 6.2.102 of
EN61326-2-1.
‘ 6.2.102 Tests with continuously present electromagnetic phenomenon
No visual degradation of parameters of the EUT is allowed during
application of the test, except as specified by the manufacturer.â€
The standard calls it an “addition†to the requirements of EN 61326-1
section 6.2 but does not indicate whether it replaces the tables there or
modifies the Criterion A requirements.
What do you think?
Thanks
John Harrington
From: [email protected] [mailto:[email protected]] On Behalf Of Kunde,
Brian
Sent: Thursday, November 06, 2008 8:12 AM
To: [email protected]
Subject: RE: Deviation of Performance Criteria
Thanks to all. Your comments were greatly appreciated and helpful.
The Other Brian
From: Martin, Charles R (GE EntSol, SensInsp)
[mailto:[email protected]]
Sent: Wednesday, November 05, 2008 6:25 PM
To: Kunde, Brian; [email protected]
Subject: RE: Deviation of Performance Criteria
Hi Brian,
I agree with you, I don't see any other statements.
Table 2 "evaluation of immunity test results" notes possible combinations
of device function, phenomenon and performance criteria. This has been
removed in EN 61326-1:2006 and the performance criteria has been added to
the immunity test requirements tables for each port and phenomenon.
Thanks,
Charlie Martin
From: [email protected] [mailto:[email protected]] On Behalf Of Kunde,
Brian
Sent: Wednesday, November 05, 2008 2:24 PM
To: Ted Eckert; [email protected]
Subject: RE: Deviation of Performance Criteria
As Doug mentioned in his email, the allowance of deviations appear to have
been removed in the 2006 version of the EN 61326-1 standard which I believe
becomes mandatory in February 2009. Can anyone else confirm this or is
there some other statement in the 2006 version that I’m not seeing that
allows the deviation?
Thanks,
The Other Brian
From: Ted Eckert [mailto:[email protected]]
Sent: Wednesday, November 05, 2008 1:53 PM
To: Kunde, Brian; [email protected]
Subject: RE: Deviation of Performance Criteria
As I read EN 61326, it allows the manufacturer to specify the performance
criteria for each test. The standard only requires that equipment shall
not become dangerous or unsafe as a result of the application of the tests.
Table 2 is only an example of evaluation of immunity test results. The
note states “…performance criteria B and/or C may be accepted provided that
both the specification and the test report highlight such deviation(s) for
the relevant combination(s) of function and test.â€
The standard does require that the deviations be listed in the
specifications in addition to the test report. If the published
specifications do not describe the deviations, the manufacturer may be
considered in noncompliance with the standard. If they have declared
compliance via the standard, this could be an issue. If the manufacturer
has chosen not to use the standards route but claims compliance with the
essential requirements of the directive, you may have an argument if the
peripheral is not suitable for its intended use because of the deviation.
I agree with David Spencer; you are the customer and the vendor needs to
meet your requirements if they want you to buy their products.
Ted Eckert
Compliance Engineer
Microsoft Corporation
[email protected]
The opinions expressed are my own and do not necessarily reflect those of
my employer.
From: Kunde, Brian [mailto:[email protected]]
Sent: Wednesday, November 05, 2008 9:59 AM
To: [email protected]
Subject: Deviation of Performance Criteria
Greetings Compliance Experts.
Something disturbing came across my desk today I thought I would get your
opinion on it.
On a CE marked peripheral we buy/sell as part of our laboratory equipment
system, failed several immunity tests when we tested it as part of our
system. When we notified the peripheral's manufacturer of the problem
(yes, I'm being purposely vague) they said the failures were ok and sent us
a "Certificate of Compliance" by a very very well know compliance lab with
the following statement:
Snip
EMC Immunity:
EN 61326-1:1997/A1:1998/A2:2001 EMC requirements for Electrical equipment
for measurement, control, and laboratory use.
- General Use for the following test with deviation of performance criteria
to Criteria "C" instead of "B".
EN 61000-4-2
EN 61000-4-3
EN 61000-4-4
Unsnip
The peripheral manufacture said the EMC test lab told them they can put the
CE marking on their product as long as they included the above deviation
statement in their documentation and DOC.
Is this true or was there some kind of miscommunication between the test
lab and the peripheral manufacturer?
With this line of thinking, our test lab will not have to fail anything in
the future; just pass it with a deviation in the requirements. (just
kidding).
Thanks to all for your opinion.
The Other Brian
_________________________
LECO Corporation Notice: This communication may contain confidential
information intended for the named recipient(s) only. If you received this
by mistake, please destroy it and notify us of the error. Thank you.
-
This message is from the IEEE Product Safety Engineering Society emc-pstc
discussion list. Website: http://www.ieee-pses.org/
To post a message to the list, send your e-mail to [email protected]
Instructions: http://listserv.ieee.org/request/user-guide.html
List rules: http://www.ieee-pses.org/listrules.html
For help, send mail to the list administrators:
Scott Douglas [email protected]
Mike Cantwell [email protected]
For policy questions, send mail to:
Jim Bacher: [email protected]
David Heald: [email protected]
All emc-pstc postings are archived and searchable on the web at:
http://www.ieeecommunities.org/emc-pstc
_________________________
LECO Corporation Notice: This communication may contain confidential
information intended for the named recipient(s) only. If you received this
by mistake, please destroy it and notify us of the error. Thank you.
-
This message is from the IEEE Product Safety Engineering Society emc-pstc
discussion list. Website: http://www.ieee-pses.org/
To post a message to the list, send your e-mail to [email protected]
Instructions: http://listserv.ieee.org/request/user-guide.html
List rules: http://www.ieee-pses.org/listrules.html
For help, send mail to the list administrators:
Scott Douglas [email protected]
Mike Cantwell [email protected]
For policy questions, send mail to:
Jim Bacher: [email protected]
David Heald: [email protected]
All emc-pstc postings are archived and searchable on the web at:
http://www.ieeecommunities.org/emc-pstc
_________________________
LECO Corporation Notice: This communication may contain confidential
information intended for the named recipient(s) only. If you received this
by mistake, please destroy it and notify us of the error. Thank you.
_____________________________________________________________________________
Scanned by IBM Email Security Management Services powered by MessageLabs.
For more information please visit http://www.ers.ibm.com
_____________________________________________________________________________
_____________________________________________________________________________
Scanned by IBM Email Security Management Services powered by MessageLabs.
For more information please visit http://www.ers.ibm.com
_____________________________________________________________________________
-
This message is from the IEEE Product Safety Engineering Society emc-pstc
discussion list. Website: http://www.ieee-pses.org/
To post a message to the list, send your e-mail to [email protected]
Instructions: http://listserv.ieee.org/request/user-guide.html
List rules: http://www.ieee-pses.org/listrules.html
For help, send mail to the list administrators:
Scott Douglas [email protected]
Mike Cantwell [email protected]
For policy questions, send mail to:
Jim Bacher: [email protected]
David Heald: [email protected]
All emc-pstc postings are archived and searchable on the web at:
http://www.ieeecommunities.org/emc-pstc
-
This message is from the IEEE Product Safety Engineering Society emc-pstc
discussion list. Website: http://www.ieee-pses.org/
To post a message to the list, send your e-mail to [email protected]
Instructions: http://listserv.ieee.org/request/user-guide.html
List rules: http://www.ieee-pses.org/listrules.html
For help, send mail to the list administrators:
Scott Douglas [email protected]
Mike Cantwell [email protected]
For policy questions, send mail to:
Jim Bacher: [email protected]
David Heald: [email protected]
All emc-pstc postings are archived and searchable on the web at:
http://www.ieeecommunities.org/emc-pstc
-
This message is from the IEEE Product Safety Engineering Society
emc-pstc discussion list. Website: http://www.ieee-pses.org/
To post a message to the list, send your e-mail to [email protected]
Instructions: http://listserv.ieee.org/request/user-guide.html
List rules: http://www.ieee-pses.org/listrules.html
For help, send mail to the list administrators:
Scott Douglas [email protected]
Mike Cantwell [email protected]
For policy questions, send mail to:
Jim Bacher: [email protected]
David Heald: [email protected]
All emc-pstc postings are archived and searchable on the web at:
http://www.ieeecommunities.org/emc-pstc
