Dear Colleagues You are invited to a meeting of the Washington DC/Northern Virginia Chapter of the EMC Society. > >> Very-Near-Field Solutions for Far-Field Problems >> Stéphane C. Attal, MBA, MSc. >> >> IEEE EMC Society Chapter Meeting >> Washington/Northern Virginia Chapter >> Date: April 3, 2013 (NOTE: CORRECTION TO DATE) >> Time: 6 p.m. >> Location: Washington Laboratories, 7560 Lindbergh Drive Gaithersburg, MD >> 20879 >> Pizza and beverages provided, courtesy of Teracomm >> No Meeting Fee >> RSVP: Theresa Kerrick: [email protected] >> >> Very-near-field measurements of radiated emissions are fast and easy to make >> and avoid the delays and the time consuming set-up of far-field measurements >> in a chamber. Very-near-field measurements allow EMC testing in less than >> one second! Using these techniques a designer can get an “emissions map” of >> a PCB or product in “real-time” to solve EMI and EMC problems early in the >> design cycle thus saving time and cost. >> In addition far-field prediction based on very-near-field measurements >> provide engineers with the world’s fastest pre-compliance verification. >> >> A demonstration of an actual “real-time” EMxpert will be shown. >> >> >> Presenter: Stéphane C. Attal, MBA, MSc., CEO, EMSCAN >> >> Stéphane Attal is a business leader with extensive experience in financing, >> building management teams, commercializing technology products and >> globalizing businesses. Trilingual in English, French, and Spanish, Mr. >> Attal has worked extensively in the U.S., Canada, Mexico, Europe, and China. >> >> >> You may remove your name from this list by going to the website >> http://listserv.ieee.org. > > >
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