Forgot to mention that these effects occur at an applied stress of less than 1/3 of the rated barrier breakdown voltages of the supplies!
Doug Sent from my iPhone iPhone: 408-858-4528 Office: 702-570-6108 Email: [email protected] Website: http://dsmith.org > On Nov 4, 2014, at 01:13, Doug Smith <[email protected]> wrote: > > Hi All, > > I was able to measure in my lab late tonight, a very important extension of > an effect I discovered earlier. That discovery describes how some power > supplies can take in a single ESD pulse and generate from it many ESD pulses > of both polarities with both human metal model and cable discharge current > waveforms embedded in corona discharges from the single original ESD pulse. > > Tonight, I was able to create the same effect using EFT (electrical fast > transient) pulses. Some power supplies can take a single EFT pulse and a > microsecond to several microseconds later generate one or more EFT pulses, > some larger that the stimulus one, embedded in corona discharges! > > This is very bad as EFT occurs much more than ESD and is not visible to > equipment operators. The EFT can be amplified and made worse by some power > supplies! This could easily the the cause of equipment failure either at > compliance testing or in the field. > > This appears to be a new phenomena that I have not seen published. I have > been able to reproduce the ESD version at a NASA Ames laboratory, my own > laboratory, and at an ESD test site on the US East Coast using different ESD > simulators and equipment. > > If you are interested in this, contact me privately at [email protected] or > call me. > > Doug > > -- > University of Oxford Tutor > Department for Continuing Education > Oxford, Oxfordshire, United Kingdom > -------------------------------------------------------------- > ___ _ Doug Smith > \ / ) P.O. Box 60941 > ========= Boulder City, NV 89006-0941 > _ / \ / \ _ TEL/FAX: 702-570-6108/570-6013 > / /\ \ ] / /\ \ Mobile: 408-858-4528 > | q-----( ) | o | Email: [email protected] > \ _ / ] \ _ / Web: http://www.dsmith.org > -------------------------------------------------------------- > > - > ---------------------------------------------------------------- > This message is from the IEEE Product Safety Engineering Society emc-pstc > discussion list. To post a message to the list, send your e-mail to > <[email protected]> > > All emc-pstc postings are archived and searchable on the web at: > http://www.ieee-pses.org/emc-pstc.html > > Attachments are not permitted but the IEEE PSES Online Communities site at > http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used > formats), large files, etc. > > Website: http://www.ieee-pses.org/ > Instructions: http://www.ieee-pses.org/list.html (including how to > unsubscribe) > List rules: http://www.ieee-pses.org/listrules.html > > For help, send mail to the list administrators: > Scott Douglas <[email protected]> > Mike Cantwell <[email protected]> > > For policy questions, send mail to: > Jim Bacher: <[email protected]> > David Heald: <[email protected]> > - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <[email protected]> All emc-pstc postings are archived and searchable on the web at: http://www.ieee-pses.org/emc-pstc.html Attachments are not permitted but the IEEE PSES Online Communities site at http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used formats), large files, etc. Website: http://www.ieee-pses.org/ Instructions: http://www.ieee-pses.org/list.html (including how to unsubscribe) List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <[email protected]> Mike Cantwell <[email protected]> For policy questions, send mail to: Jim Bacher: <[email protected]> David Heald: <[email protected]>
