Not an answer, but one would expect some sort of correlation between the 61000-4-6 levels of 1, 3, and 10 V, and the 61000-4-3 levels of 1, 3, and 10 V/m.
But I have asked for and never seen the derivation. Ken Javor Phone: (256) 650-5261 Hello all, I am looking for background information on the rationale behind the conducted immunity test levels defined in EN 55035 / CISPR 35 and IEC 61000-4-6. Specifically, in 55035:2016 table 2, clause 2.1 calls for a test level of 3V rms from 0.15 to 10MHz. It also defines a slope that reduces the signal level above 10MHz. What is the technical rationale behind 3V rms being the desired immunity level for ITE equipment? Second, why does the voltage level taper above 10MHz in 55035, as opposed to 55024, where the test remains constant from 150kHz - 80MHz? IEC 61000-4-6 also calls for 1V, 3V, 10V rms test levels and calls for 80% AM modulation "to simulate actual threats". Is the rationale behind this documented somewhere? What threats were considered? I suspect this is a rabbit hole, but curiosity (and a concerned client) has gotten the best of me. -- Jeff Keyzer MightyOhm LLC [email protected] - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <[email protected]> All emc-pstc postings are archived and searchable on the web at: http://www.ieee-pses.org/emc-pstc.html Attachments are not permitted but the IEEE PSES Online Communities site at http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used formats), large files, etc. Website: http://www.ieee-pses.org/ Instructions: http://www.ieee-pses.org/list.html (including how to unsubscribe) <http://www.ieee-pses.org/list.html> List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <[email protected]> Mike Cantwell <[email protected]> For policy questions, send mail to: Jim Bacher <[email protected]> David Heald <[email protected]> - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <[email protected]> All emc-pstc postings are archived and searchable on the web at: http://www.ieee-pses.org/emc-pstc.html Attachments are not permitted but the IEEE PSES Online Communities site at http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used formats), large files, etc. Website: http://www.ieee-pses.org/ Instructions: http://www.ieee-pses.org/list.html (including how to unsubscribe) <http://www.ieee-pses.org/list.html> List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <[email protected]> Mike Cantwell <[email protected]> For policy questions, send mail to: Jim Bacher <[email protected]> David Heald <[email protected]> - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <[email protected]> All emc-pstc postings are archived and searchable on the web at: http://www.ieee-pses.org/emc-pstc.html Attachments are not permitted but the IEEE PSES Online Communities site at http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used formats), large files, etc. Website: http://www.ieee-pses.org/ Instructions: http://www.ieee-pses.org/list.html (including how to unsubscribe) List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <[email protected]> Mike Cantwell <[email protected]> For policy questions, send mail to: Jim Bacher: <[email protected]> David Heald: <[email protected]>
