Dear fellow Gwyddion users, The reason I am contacting you for help and seeking support from the community is I have a few datasets obtained using Kelvin probe force microscopy (KPFM) and I am not sure how to analyze this data using Gwyddion. What I am struggling with is how to use the reference data measured (measurements on e.g. HOPG) to determine the work function of the probe, to subsequently calibrate the measurement, which can then be used to determine the surface potential (or work function) of the film being characterized. Is there a tutorial or some documentation on what operations are required for performing the analysis in Gwyddion? Any information you can provide will be very much appreciated. Thank you in advance for your time and understanding.
Respectfully, Steven ________________________________ This email and any attachments to it may be confidential and are intended solely for the use of the individual to whom it is addressed. Any views or opinions expressed are solely those of the author and do not necessarily represent those of Plessey Semiconductors Ltd. If you are not the intended recipient of this email, you must neither take any action based upon its contents, nor copy or show it to anyone. Please contact the sender if you believe you have received this email in error Plessey Semiconductors Ltd is a company registered in England and Wales under number 4129612 with VAT number GB 153 1509 35
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