virajjasani commented on a change in pull request #673: HBASE-23093 : Avoid
Optional Anti-Pattern where possible
URL: https://github.com/apache/hbase/pull/673#discussion_r333506364
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File path:
hbase-server/src/main/java/org/apache/hadoop/hbase/regionserver/StoreScanner.java
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@@ -351,11 +350,11 @@ public StoreScanner(ScanInfo scanInfo, ScanType scanType,
// Used to instantiate a scanner for compaction in test
@VisibleForTesting
- StoreScanner(ScanInfo scanInfo, OptionalInt maxVersions, ScanType scanType,
+ StoreScanner(ScanInfo scanInfo, int maxVersions, ScanType scanType,
List<? extends KeyValueScanner> scanners) throws IOException {
// 0 is passed as readpoint because the test bypasses Store
- this(null, maxVersions.isPresent() ? new
Scan().readVersions(maxVersions.getAsInt())
- : SCAN_FOR_COMPACTION, scanInfo, 0, 0L, false, scanType);
+ this(null, maxVersions > 0 ? new Scan().readVersions(maxVersions)
Review comment:
From the code, I felt > 0 could be safe bet(this is maxVersion of Scan,
default value is 1), btw this constructor is not being used anywhere else other
than unit tests: TestStoreScanner.java
Hence, is it fine to have this check?
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