Hi Seb,
Sebastien Lelong wrote: > I'd like to include page about test results, generated from the testing > matrix. But I need you (all) to adhere to it, that is to use it: when you > test something, just register the result in the matrix, using the wrapper. I have not used this feature of your wrapper, but I'll try it soon. Do I have to (re-)register my old blink-tests? Another point: it took me quite some time to do all my blink tests. There are groups with almost the same pin layout, but I had to modify the circuit (on my breadboard) several times. For non-trivial changes I did some 'random' tests (2 or 3 different PICs) fotr the PIC for which these changes were made. But strictly speaking al other previous tests must be repeated. I don't like the idea of having to repeat that for seemingly trivial changes..... For future tests I might build a couple of experiment boards (Veroboard?), one for each 'pin-compatible' group. Will take some time now, but will speed up regression testing later. Maybe I could used Wouter's dwarf boards, I have no experience with these. Regards, Rob. -- Rob Hamerling, Vianen, NL (http://www.robh.nl/) --~--~---------~--~----~------------~-------~--~----~ You received this message because you are subscribed to the Google Groups "jallib" group. To post to this group, send email to [email protected] To unsubscribe from this group, send email to [EMAIL PROTECTED] For more options, visit this group at http://groups.google.com/group/jallib?hl=en -~----------~----~----~----~------~----~------~--~---
