On Sun, Apr 14, 2019 at 09:58:40PM +0000, Adamski, Krzysztof (Nokia -
PL/Wroclaw) wrote:
> Document new ABI attributes: {in,power,curr,temp}_samples and samples.
>
> Signed-off-by: Krzysztof Adamski <[email protected]>
Applied to hwmon-next.
Thanks,
Guenter
> ---
> Documentation/hwmon/sysfs-interface | 18 ++++++++++++++++++
> 1 file changed, 18 insertions(+)
>
> diff --git a/Documentation/hwmon/sysfs-interface
> b/Documentation/hwmon/sysfs-interface
> index 2b9e1005d88b..7b91706d01c8 100644
> --- a/Documentation/hwmon/sysfs-interface
> +++ b/Documentation/hwmon/sysfs-interface
> @@ -756,6 +756,24 @@ intrusion[0-*]_beep
> 1: enable
> RW
>
> +********************************
> +* Average sample configuration *
> +********************************
> +
> +Devices allowing for reading {in,power,curr,temp}_average values may export
> +attributes for controlling number of samples used to compute average.
> +
> +samples Sets number of average samples for all types of
> measurements.
> + RW
> +
> +in_samples
> +power_samples
> +curr_samples
> +temp_samples Sets number of average samples for specific type of
> measurements.
> + Note that on some devices it won't be possible to set all of
> them
> + to different values so changing one might also change some
> others.
> + RW
> +
>
> sysfs attribute writes interpretation
> -------------------------------------
