We add a new sys node for ecc step. So update the ABI document about it.
Signed-off-by: Huang Shijie <[email protected]>
---
Documentation/ABI/testing/sysfs-class-mtd | 11 +++++++++++
1 files changed, 11 insertions(+), 0 deletions(-)
diff --git a/Documentation/ABI/testing/sysfs-class-mtd
b/Documentation/ABI/testing/sysfs-class-mtd
index 3105644..62a1cda 100644
--- a/Documentation/ABI/testing/sysfs-class-mtd
+++ b/Documentation/ABI/testing/sysfs-class-mtd
@@ -173,3 +173,14 @@ Description:
This is generally applicable only to NAND flash devices with ECC
capability. It is ignored on devices lacking ECC capability;
i.e., devices for which ecc_strength is zero.
+
+What: /sys/class/mtd/mtdX/ecc_step
+Date: May 2013
+KernelVersion: 3.10
+Contact: [email protected]
+Description:
+ The size of ecc step which is used for per ecc correction.
+ See more in the ecc_strength above. This will always be a
+ non-negative integer.
+
+ In the case of devices lacking any ECC capability, it is 0.
--
1.7.1
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