Hello,
the commit "extend the test result to a bit field so we can extend the output
further" from July 20th unfortunately changes the code, that was previously a
bitfield, to a non-bitfield. This causes FAILED tests to return erroneously 0.
This patch changes the test result codes to be individual bits in the bitfield
(effectively reverting a small part of aforementioned patch).
Regards
Jiri Palecek
---
include/test.h | 12 ++++++------
1 files changed, 6 insertions(+), 6 deletions(-)
diff --git a/include/test.h b/include/test.h
index 5c325b3..4d9803a 100644
--- a/include/test.h
+++ b/include/test.h
@@ -44,15 +44,15 @@
#include "compiler.h"
-/* Use low 4 bits to encode test type */
-#define TTYPE_MASK 0xf
+/* Use low 6 bits to encode test type */
+#define TTYPE_MASK 0x3f
#define TPASS 0 /* Test passed flag */
#define TFAIL 1 /* Test failed flag */
#define TBROK 2 /* Test broken flag */
-#define TWARN 3 /* Test warning flag */
-#define TRETR 4 /* Test retire flag */
-#define TINFO 5 /* Test information flag */
-#define TCONF 6 /* Test not appropriate for configuration flag */
+#define TWARN 4 /* Test warning flag */
+#define TRETR 8 /* Test retire flag */
+#define TINFO 16 /* Test information flag */
+#define TCONF 32 /* Test not appropriate for configuration flag */
#define TTYPE_RESULT(ttype) ((ttype) & TTYPE_MASK)
#define TERRNO 0x100 /* Append errno information to output */
--
1.6.3.3
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