Hello fellow Meep users! I am measuring the enhancement of the electric field at the tip of a nickel nanotip with a silver coating on top. When I measure and compare to a blank field, the enhancement is 10^13. I find this improbable, and I ask the community for any advice on the matter.
To measure the enhancement, I first run the simulation with the dielectric in the cell. I use h5totxt at a point near the tip. Then I run the simulation without the dielectric and again use h5totxt at the same point. Then I calculate the enhancement by using the equation |E|/|Eo| and graph it over time. My ctl file also includes a tilted-beam source function. At 30 and 45 degrees, the enhancement is stable around 1, but dips above and below approximately two magnitudes. Even at a 1-degree tilt, I still see a small enhancement, but when I run with a tilted incident beam at 0.01 degrees I notice a larger enhancement. I have also run the simulation with PML over the entire cell to cancel out any interference from neighboring cells. This lowers the enhancement by 10^2, but it is not enough. Any help on the matter is appreciative. Thanks in advance! --Steele Attachment: ctl file
AgNitip-Ni-CW-field.ctl
Description: Binary data
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