Dear Colin,
I am following with interest the discussion you started on the modeling of
low angle XRD peaks. I, too, have had difficulty modeling data with our
inhouse Philips diffractometer (even with function #3 as suggested to me by
Bob von Dreele) and have begun to question Philips directly about the
possibility of alignment problems. On similar samples, data refinement of
Scintag data proceeded smoothly, so this again points to a problem with the
diffractometer itself. May I ask what type of machine you are using?
Thanks and good luck!
Rick Jacubinas
