Title: Nachricht
Dear Dr. Kern:
 
I am interested in this topic applied to microstructural analysis.
 
I would like to receive also a copy of the paper that you have offer.
 
Thank you very much.
 
Yours sincerely,
Jose M. Amigo
 
University of Valencia
Department of Geology
Crystallography and Mineralogy area
Campus de Burjassot
46100 - Burjassot
SPAIN
 
----- Original Message -----
Sent: Wednesday, October 06, 2004 1:38 PM
Subject: AW: shape of the instrumental profiles

Dear Angel,
 
the instrument profile is the convolution product of the source emission profile and various instrument contributions. For lab diffractometers the source emission profile has a Lorentzian type shape. Particularily for Bragg-Brentano type diffractometers, at low angles, the instrument function shape is dominated by the detector slit, which can be sufficiently approximated by a hat (impulse) function. The convolution product of the source emission profile and the detector slit contribution looks Gaussian-like, but a Gaussian is not an ideal approximation for this. At higher angles the source emission profile dominates, thats why the instrument function is more Lorentzian type.
 
I can offer you a detailed paper about this issue, please let me know if you would like to receive it.
 
Cheers,
 
Arnt
-----Urspr�ngliche Nachricht-----
Von: Angel L. Ortiz [mailto:[EMAIL PROTECTED]
Gesendet: Mittwoch, 6. Oktober 2004 12:44
An: [EMAIL PROTECTED]
Betreff: shape of the instrumental profiles

Dear colleagues:

 

Does anyone know why the instrumental profiles (instrumental resolution) are generally Gaussian for low diffraction angles, whereas turns to Lorentzian for high diffraction angles?.

 

Any advice is greatly appreciated.

 

Thanks in advance,

 

Prof. Angel L. Ortiz



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