Dear all
I have deposited (001) oriented thin film of La0.7Ca0.3MnO3 on
LaAlO3 substrate. Now i want to do X-ray diffraction measurement
to get to know the film quality, is it realy oriented along the
(001) axis or not. I have done the litrature surve and found that
2-theta scan will be the best option.
Can some body suggest how to do 2-theta scan for these films as in the
normal scan, when we are taking glacing angle 2degree to 6 degree, it
is showing lot of peaks but actually it should show only two peaks one
at ~23degree and second 46 degree in the 20 to 70 degree range.
Please suggest how to do the correct X-ray diffraction measurement for
these films. what should be the positions of the source, sample and
detector.
with regards
sincerely
brajendra.
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there's is nothing IMpossible in this world as
the word itself says "IMPossible".
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Brajendra Singh [EMAIL PROTECTED]
Research Scholar contact No.
C/o Prof.S.Sundar Manoharan +91-0512-2596043
Department of Chemistry
IIT Kanpur-208016, INDIA.
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