Vahit This could be what you're after: Volume 109, Number 1, January-February 2004 Journal of Research of the National Institute of Standards and Technology Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers R.W. Cheary, A.A. Coehlo & J.P. Cline
Have a look at papers by Cheary and Coehlo. They've done quite a bit of work on
instrumental broadening (particularly on axial divergence) for their
fundamental parameters approach.
Cheers
Matthew
________________
Matthew Rowles
CSIRO Minerals - Clayton
Ph: ᄉ 3 9545 8892
Fax: ᄉ 3 9562 8919 (site)
Email: [EMAIL PROTECTED]
-----Original Message-----
From: Vahit Atakan [mailto:[EMAIL PROTECTED]
Sent: Tue 26/06/2007 12:22
To: rietveld_l@ill.fr
Cc:
Subject: Instrumental broadening
Dear all,
In the book "The Rietveld Method" edited by young, (Page 114 chapter 7,
part 7.2.3) five instrumental contributions were discussed.
Broadening due to:
1) Source
2) Flat specimen
3) Axial divergence
4) Speciment transparency
5) Receiving slit
I`m looking for a reference that has a figure showing the effect of each
contribution on a peak. The explanation in the book is suffuciant but it
would be better to see an image if there is any.
Vahit
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