The following paragraph is from "Rietveld Analysis Program BGMN"  (copyright 
2006 by J bergmann, Dresden).  (scanned and recognized by an OR program)

"The advantages of the variable divergence slits are:   ;     
• Correct intensity values in the entire angular range because of the sample 
holder is not irradiated
• Higher intensity in the case of high angles in comparison to the fixed slit
• Better grain statistics especially for higher angles  
• Lower angular limit due to prevention of irradiation of sample boundaries     
• Low intensity of the background at low angles
Therefore, it is explicitely recommended to use automatic divergence slits in 
structure refinement and phase analysis."



----- Original Message -----
From: [EMAIL PROTECTED]
To: [email protected]
Date: Tue, 07 Aug 2007 16:15:59 +0100
Subject: Re: fixed slits or fixed radiated length Bragg-Brentano   XRPD

> Dear Silvina,
> 
> The purpose of divergence slits is to increase the intensities of 
> reflections at
> high angle, the flip side is an increase in background and peak 
> broadening (that
> will extenuate peak overlap) at high angle.
> 
> For structural work it is best to stay with fixed slits, no 
> modification needed
> for the profile function  - though TOPAS (academic) is the only program
> to date (I know of) that can model divergence slits.
> 
> Old school techniques of counting for longer at high angle is the best way 
> to
> improve stats and will not unduly effect your profile function.
> 
> Divergence slits are useful for phase identification especially if you are
> processing a bulk number of samples. Stick with fixed slits for Rietveld
> analysis.
> 
> Regards
> 
> William Bisson
> CCP14 administrator
> http://www.ccp14.ac.uk
> 
> Quoting Silvina Pagola <[EMAIL PROTECTED]>:
> 
> > Hi,
> > I have a question regarding the use of fixed radiated length data in 
> > a laboratory powder diffractometer, with Bragg-Brentano geometry and 
> > programmable divergence and antiscatter/receiving slits, which can 
> > also be used in the "fixed slit" mode (in which the irradiated length 
> > on the sample varies with the theta angle).
> > This is, for what cases the fixed radiated lenght is recommended 
> > instead of fixed slits data?.
> > I have only these two choices for structure solution. For one 
> > compound I solved, it seems to work better the fixed radiated length 
> > data, although the background increases at high angles and I have to 
> > refine absorption (surface roughness), to get positive thermal 
> > factors. Could someone explain why to use one dataset or the other 
> > for structure solution and refinement?
> > Thanks,
> > Silvina.
> >
> 
> 
> 

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