Dear Colleagues,
We are organizing the ****11^th workshop on Combined Analysis Using Ray
Scattering**, July 5^th - 9^th 2021, in Caen, France.
We hope the worldwide situation evolves positively so that this workshop
can take place.
More details here:
Agenda:
http://www.ecole.ensicaen.fr/~chateign/formation/agendas/Flyer-workshop-CA-2021.pdf
<http://www.ecole.ensicaen.fr/~chateign/formation/Programs/2020_CombinedAnalysis_flyer.pdf>Program:
http://www.ecole.ensicaen.fr/~chateign/formation/Programs/2021-program_11th_workshop.pdf
* _Registration links:_
French:https://www.azur-colloque.fr/DR19/inscription/inscription/55/fr
<https://www.azur-colloque.fr/DR19/inscription/inscription/55/fr>
English: https://www.azur-colloque.fr/DR19/inscription/inscription/55
<https://www.azur-colloque.fr/DR19/inscription/inscription/55>
* _Registration deadline_ : *June 15^th *, 2021
To get more insights about Combined Analysis visit the web site:
http://www.ecole.ensicaen.fr/~chateign/formation/
<http://www.ecole.ensicaen.fr/~chateign/formation/>
Sincerely,
Stéphanie Gascoin, Daniel Chateigner, Luca Lutterotti
*/What is the Combined Analysis approach?/*
Quickly, the Combined Analysis methodology is an approach allowing to
extract as maximum information as possible from scattering patterns
[preferred orientations (ODF, pole figures), residual stresses
(homogenisation models of elastic tensors), microstructures (iso-
anisotropic sizes, microstrains, distributions, faults), phase analysis
(crystalline or mixtures of crystallines/amorphous), structures,
thickness and roughness (specular reflectivity)], x-ray reflectivity and
fluorescence. It allows individual algorithms to interact with each
other to reach a global minimum for simultaneously all the refined
parameters. The Rietveld method serves the core of the methodology, and
all is integrated in the user-friendly software MAUD.
Each analysis type will be first described, then integrated in the
combined approach, and each day of the workshop will be dedicated to one
or two characterisation type (texture, reflectivity ...) and to its
practice. Mornings will consist of courses, afternoons of practical
training on your own computers.
All the materials will be downloadable prior to the workshop.
People working on real materials (time-consuming or hard to elaborate,
rare, subjected to change under grinding or impossible to grind, films
or multilayers, ...), are a priori interested by this workshop.
Personal examples can be brought to Caen, might be measured before or
during the workshop.
--
----------------------------------------------------------------------
Daniel Chateigner
Professeur Normandie Universite
www.ecole.ensicaen.fr/~chateign/danielc/
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Editor: "Combined Analysis", Wiley-ISTE:
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/
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Address:
CRISMAT-ENSICAEN and IUT-Caen,
Universite de Caen Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
daniel.chateig...@ensicaen.fr
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Open Databases:
Material Properties Open Database (MPOD): mpod.cimav.edu.mx
Crystallography Open Database (COD): www.crystallography.net/cod/
Theoretical (TCOD): www.crystallography.net/tcod/
Predicted (PCOD): www.crystallography.net/pcod/
Raman Open Database (ROD): solsa.crystallography.net/rod/
Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/
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