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Von: Armel Le Bail [EMAIL PROTECTED]
An: RIETVELD_L Distribution List [EMAIL PROTECTED]
Gesendet: Mittwoch, 14. Juni 2000 21:20
Betreff: Re: Best powder diffractometer (was: None)
Obtaining patterns of reference materials is the only way to
compare
I assume you are talking about the Huber Imaging Plate Guinier Camera 670,
right?
No. It had a shape very similar to the INEL 120°curved detector, but
covering 140°, and with a different detection technology - Was not
Huber ?;-).
There are a lot of reference patterns on the web site. Just look
Which x-ray powder diffractometer is the best? What is the
best optics for the diffractometer. What is the best
detection pathway etc.
Have a look at a previous discussion regularly updated, showing
real powder patterns of standard materials from different
powder diffractometers in various
Which x-ray powder diffractometer is the best? What is the
best optics for the diffractometer. What is the best
detection pathway etc.
Have a look at a previous discussion regularly updated, showing
real powder patterns of standard materials from different
powder diffractometers in
Joe,
You'll have fun and learn a lot of strange things playing with powders (I know
I have).
We have both a Siemens (Bruker) D5000 and two INEL systems. Both give
excellent data, etc. The INEL systems, due to the parallel beam optics are way more
sensitive to alignment.
A change since the above page was written is the
availability(?) of various mirror/capilliary focussing
systems options to increase flux and specialist
applications. I have not used a powder diffractometer
that has these new features though.
Obtaining patterns of reference materials is the
A change since the above page was written is the
availability(?) of various mirror/capilliary focussing
systems options to increase flux and specialist
applications. I have not used a powder diffractometer
that has these new features though.
Obtaining patterns of reference materials is
Which would you go for?
In that order :
The more robust machine (after all, they cost like a house
but they are not guaranteed more than one year, which is
ridiculous - car manufacturers compete on the guarantee
length, why not powder diffractometer manufacturers ?),
fulfilling all my special
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Dear Mr. Le Bail
again I have to point Your attention to the fact, that the PDF products of the
ICDD are compiled for phase identification in the field of condensed matter. It
was not the basic idea to collect all data of crystalline phases. And as a
further point, one should keep in mind,
In a message dated 01/07/2000 1:44:11 AM Pacific Standard Time,
[EMAIL PROTECTED] writes:
5. Industrial scientists are usually not interested in structural data,
their
main interests are quality control and qualitative raw materials
characterization. Think of cement industries.
Wrong
l data to their entries.
Well, this is surely the interest of FIZ. But if the copy can be made
for free, then ICSD may (should) have made the choice to do the
same. In fact, if ICDD had made that choice when it was founded
in 1941, as the "Joint Commitee on Chemical Analysis by X-ray
Diffract
I'd really appreciate if someone could tell me which are the papers
presenting analyticaly Le Bail Algorithm and the Powley method for
intensity extraction out of powder data. .
Thank you in advance
Eva Dova
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Date: Tue, 09 Nov 1999 07:26:32 +0100
To: RIETVELD_L Distribution List [EMAIL PROTECTED]
From: Armel Le Bail [EMAIL PROTECTED]
Subject: Re: Advice on a new
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J. A. Gavira Gallardo
Laboratorio de Estudios Cristalograficos
I.A.C.T CSIC-UGRA.
Facultad de Ciencias. Granada 18002. Spain
Fax: +34-958-243384; Phone: +34-958-243360
email: [EMAIL PROTECTED]
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J. A. Gavira Gallardo
Laboratorio de Estudios Cristalograficos
I.A.C.T CSIC-UGRA.
Facultad de Ciencias. Granada 18002. Spain
Fax: +34-958-243384; Phone: +34-958-243360
email: [EMAIL PROTECTED]
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