Hi,
Self Citation: "NIST Standard Reference Materials for
Characterization of Instrument Performance" Industrial Applications
of X-ray Diffraction Ed by F. H. Chung & D. K. Smith, pp 903-917. A
pdf is available; email to request.
In this I outline how I use SRM 660 (it was 660 in 2000, then
synchrotron and neutron) can be found at
http://mysite.du.edu/~balzar/s-s_rr.htm.
Davor BalzarUniversity of Denverwww.du.eduwww.du.edu/~balzar
- Original Message -
From: "Maxim V. Lobanov" <[EMAIL PROTECTED]>
Date: Sunday, November 30, 2008 10:37 pm
Subject: RE: Riet
Brian wrote:
>U and W should be instrumental constants that will not change with >sample,
>while V can have both an instrumental and a
>residual stress component.
Maxim wrote:
>as far as I understand, the strain broadening term should have FWMM~theta
>>dependence, i.e. Lorentzian Y in "standard"
Toby [mailto:[EMAIL PROTECTED]
Sent: Monday, December 01, 2008 5:21 AM
To: May, Frank
Cc: rietveld_l@ill.fr
Subject: Re: Rietveld: U,V,W
What is the correct procedure for refining U,V,W? It is my understanding
that those parameters are a function of instrument geometry. Does one use a
standard m
Why my reply went to the author's personal mail box? I am very sorry for that.
Now I am hunting for a standard reference material to determine the
profile parameters of our instrument X'pert Pro.
--
Mingtao Li
State Key Laboratory of Multiphase Flow in Power Engineering
School of Energy and Powe
What is the correct procedure for refining U,V,W? It is my
understanding that those parameters are a function of instrument
geometry. Does one use a standard material to determine U,V,W and
then fix their values for the instrument you're using?or do the
values of U,V,W change dependin
To all:
What is the correct procedure for refining U,V,W? It is my understanding that
those parameters are a function of instrument geometry. Does one use a
standard material to determine U,V,W and then fix their values for the
instrument you're using?or do the values of U,V,W change dep
