Re: cRs

2009-03-06 Thread Eduard E. Levin
Dear Olga! Maybe you should explain what do you mean by saying background? To my opinion you were given an exhaustive answer, but you still disagree with companions. This is puzzling. I suppose that you are assigning as background contribution from partially amorphous phase. Glass sample

Re: grazing angle diffraction in single-crystal Si

2009-04-24 Thread Eduard E. Levin
Hi Angel, I think that such patterns will be of little help to you. If you have a perfect Si crystal then double diffraction may appear and forbidden reflections can be seen. Yesterday we discussed with my collegue his diffraction experiments with Si crystal cut along (100). He said that he

Re: defect measurement

2009-09-09 Thread Eduard E. Levin
Dear Angel, I think you should pay attention to articles by Paolo Scardi and Matteo Leoni. They have developed a very powerful technique called WPPM (Whole Powder Pattern Modelling) which is designed for microstructural analysis from XRD data. I suggest that you should check these papers:

Re: Explaining for broadening of peaks due to a shift of theta in theta-two theta scanning?

2010-02-19 Thread Eduard E. Levin
Dear Huy, as it was pointed out in previous letter by Joerg Bergmann, line broadening is caused by violation of theta-2theta relationship. More info can be found in the following articles: 1. R. Berthold. Z. Angew. Phys. 7 (1955) 443. 2. H. Toraya, J. Yoshino. J. Appl. Cryst. 27 (1994) 961.

Fullprof manual?

2014-07-18 Thread Eduard E. Levin
Dear Rietvelders, recently I had an urge in reading Fullprof manual, but found that it is not available via the link: http://www.ill.eu/sites/fullprof/downloads/FullProf_Manual.zip All I can see is the error message: The requested URL /sites/fullprof/downloads/FullProf_Manual.zip was not found

Re: Powder Diffraction Discussion Group on Facebook

2015-06-09 Thread Eduard E. Levin
Dear all, my five cents to this discussion, if I may add. The problem of facebook for me is that there is no search mechanism. As a consequence, questions one and the same will appear again and again as we saw here and how it is on ResearchGate now. Add content built-in filtering on top of

Re: Powder Diffraction Discussion Group on Facebook

2015-06-09 Thread Eduard E. Levin
To: 'Eduard E. Levin' ; rietveld_l@ill.fr Subject: RE: Powder Diffraction Discussion Group on Facebook In the right side under the picture, there is search in this group function -- Eduard Levin Department of Electrochemistry Chemical Faculty Moscow State University Leninskie Gory 1.-Str.3

RE: Parafocussing definition?

2016-05-02 Thread Eduard E. Levin
Dear James, For me too, please, if it would not be much of a trouble. Thank you in advance! Eduard On Mon, 2 May 2016 11:09:31 +, Cline, James Dr. (Fed) wrote > Bob Cheary and I developed and presented a workshop several times in the > 1990's that included a discussion of this issue.  I

Re: error bars of lattice parameters

2017-02-20 Thread Eduard E. Levin
Dear Jin Peng, that is a bit time consuming, but possible. I suggest reading NIST SRM certificates, they contain description of sampling, data collection and treatment. For example, LaB6: https://www-s.nist.gov/srmors/view_cert.cfm?srm=660C That should give you a general idea. Kind regards,

Re: ITC scattering factors: Table 6.1.1.1: Ne

2023-04-11 Thread Eduard E. Levin
Hi Matthew, I checked 2006 edition (the last available at IUCr), and the value in the table is 2.517 for both s=0.60 and 0.65. Regards, Eduard From: Matthew Rowles Sent: Tuesday, April 11, 2023 2:12 PM To: RIETVELD_L Distribution List Subject: ITC scattering factors: Table 6.1.1.1: Ne Hi

Re: recommended questions to XRD supplier.

2023-06-14 Thread Eduard E. Levin
Hi Shay, We owe Aeris, so maybe I can provide some experience. The external loader is absolutely outstanding and adds flexibility to the experiment - no need to stop the experiment to load/unload samples as with Miniflex, D2 or TDM-20. Overnight/weekend measurements of up to six samples - very