Dear Olga!
Maybe you should explain what do you mean by saying background?
To my opinion you were given an exhaustive answer, but you still disagree
with companions.
This is puzzling.
I suppose that you are assigning as background contribution from partially
amorphous phase.
Glass sample
Hi Angel,
I think that such patterns will be of little help to you. If you have a
perfect Si crystal then double diffraction may appear and forbidden
reflections can be seen. Yesterday we discussed with my collegue his
diffraction experiments with Si crystal cut along (100). He said that he
Dear Angel,
I think you should pay attention to articles by Paolo Scardi and Matteo
Leoni.
They have developed a very powerful technique called WPPM (Whole Powder
Pattern Modelling) which is designed for microstructural analysis from XRD
data.
I suggest that you should check these papers:
Dear Huy,
as it was pointed out in previous letter by Joerg Bergmann, line broadening
is caused by violation of theta-2theta relationship.
More info can be found in the following articles:
1. R. Berthold. Z. Angew. Phys. 7 (1955) 443.
2. H. Toraya, J. Yoshino. J. Appl. Cryst. 27 (1994) 961.
Dear Rietvelders,
recently I had an urge in reading Fullprof manual, but found that it is not
available via the link:
http://www.ill.eu/sites/fullprof/downloads/FullProf_Manual.zip
All I can see is the error message:
The requested URL /sites/fullprof/downloads/FullProf_Manual.zip was not found
Dear all,
my five cents to this discussion, if I may add.
The problem of facebook for me is that there is no search mechanism. As a
consequence, questions one and the same will appear again and again as we saw
here and how it is on ResearchGate now. Add content built-in filtering on top
of
To: 'Eduard E. Levin' ; rietveld_l@ill.fr
Subject: RE: Powder Diffraction Discussion Group on Facebook
In the right side under the picture, there is search in this group function
--
Eduard Levin
Department of Electrochemistry
Chemical Faculty
Moscow State University
Leninskie Gory 1.-Str.3
Dear James,
For me too, please, if it would not be much of a trouble.
Thank you in advance!
Eduard
On Mon, 2 May 2016 11:09:31 +, Cline, James Dr. (Fed) wrote
> Bob Cheary and I developed and presented a workshop several times in the
> 1990's that included a discussion of this issue. I
Dear Jin Peng,
that is a bit time consuming, but possible.
I suggest reading NIST SRM certificates, they contain description of sampling,
data collection and treatment.
For example, LaB6: https://www-s.nist.gov/srmors/view_cert.cfm?srm=660C
That should give you a general idea.
Kind regards,
Hi Matthew,
I checked 2006 edition (the last available at IUCr), and the value in the table
is 2.517 for both s=0.60 and 0.65.
Regards,
Eduard
From: Matthew Rowles
Sent: Tuesday, April 11, 2023 2:12 PM
To: RIETVELD_L Distribution List
Subject: ITC scattering factors: Table 6.1.1.1: Ne
Hi
Hi Shay,
We owe Aeris, so maybe I can provide some experience.
The external loader is absolutely outstanding and adds flexibility to the
experiment - no need to stop the experiment to load/unload samples as with
Miniflex, D2 or TDM-20. Overnight/weekend measurements of up to six samples -
very
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